Spiridon, A., Pollacco, E., Roeder, B.T., Saastamoinen, A., Chyzh, R., Dag, M., Tribble, R.E., Trache, L., Pascovici, G., De Oliveira, R. (2016) Upgrade of the TAMU MDM-focal plane detector with MicroMegas technology. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 376. 364-368 doi:10.1016/j.nimb.2016.02.011
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Upgrade of the TAMU MDM-focal plane detector with MicroMegas technology | ||
Journal | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | ||
Authors | Spiridon, A. | Author | |
Pollacco, E. | Author | ||
Roeder, B.T. | Author | ||
Saastamoinen, A. | Author | ||
Chyzh, R. | Author | ||
Dag, M. | Author | ||
Tribble, R.E. | Author | ||
Trache, L. | Author | ||
Pascovici, G. | Author | ||
De Oliveira, R. | Author | ||
Year | 2016 (June) | Volume | 376 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.nimb.2016.02.011Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5653170 | Long-form Identifier | mindat:1:5:5653170:5 |
GUID | 0 | ||
Full Reference | Spiridon, A., Pollacco, E., Roeder, B.T., Saastamoinen, A., Chyzh, R., Dag, M., Tribble, R.E., Trache, L., Pascovici, G., De Oliveira, R. (2016) Upgrade of the TAMU MDM-focal plane detector with MicroMegas technology. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 376. 364-368 doi:10.1016/j.nimb.2016.02.011 | ||
Plain Text | Spiridon, A., Pollacco, E., Roeder, B.T., Saastamoinen, A., Chyzh, R., Dag, M., Tribble, R.E., Trache, L., Pascovici, G., De Oliveira, R. (2016) Upgrade of the TAMU MDM-focal plane detector with MicroMegas technology. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 376. 364-368 doi:10.1016/j.nimb.2016.02.011 | ||
In | (2016) Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 376. Elsevier BV |
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