Lalwani, Kavita, Jain, Geetika, Dalal, Ranjeet, Ranjan, Kirti, Bhardwaj, Ashutosh (2016) Study the radiation damage effects in Si microstrip detectors for future HEP experiments. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 379. 262-264 doi:10.1016/j.nimb.2016.03.054
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Study the radiation damage effects in Si microstrip detectors for future HEP experiments | ||
Journal | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | ||
Authors | Lalwani, Kavita | Author | |
Jain, Geetika | Author | ||
Dalal, Ranjeet | Author | ||
Ranjan, Kirti | Author | ||
Bhardwaj, Ashutosh | Author | ||
Year | 2016 (July) | Volume | 379 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.nimb.2016.03.054Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5653367 | Long-form Identifier | mindat:1:5:5653367:9 |
GUID | 0 | ||
Full Reference | Lalwani, Kavita, Jain, Geetika, Dalal, Ranjeet, Ranjan, Kirti, Bhardwaj, Ashutosh (2016) Study the radiation damage effects in Si microstrip detectors for future HEP experiments. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 379. 262-264 doi:10.1016/j.nimb.2016.03.054 | ||
Plain Text | Lalwani, Kavita, Jain, Geetika, Dalal, Ranjeet, Ranjan, Kirti, Bhardwaj, Ashutosh (2016) Study the radiation damage effects in Si microstrip detectors for future HEP experiments. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 379. 262-264 doi:10.1016/j.nimb.2016.03.054 | ||
In | (2016) Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 379. Elsevier BV |
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