Soueidan, M., Roumié, M., Nsouli, B. (2017) PIXE detection limit for aluminium thin film deposited on Si-based matrix. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 406. 71-74 doi:10.1016/j.nimb.2017.03.058
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | PIXE detection limit for aluminium thin film deposited on Si-based matrix | ||
Journal | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | ||
Authors | Soueidan, M. | Author | |
Roumié, M. | Author | ||
Nsouli, B. | Author | ||
Year | 2017 (September) | Volume | 406 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.nimb.2017.03.058Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5654709 | Long-form Identifier | mindat:1:5:5654709:8 |
GUID | 0 | ||
Full Reference | Soueidan, M., Roumié, M., Nsouli, B. (2017) PIXE detection limit for aluminium thin film deposited on Si-based matrix. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 406. 71-74 doi:10.1016/j.nimb.2017.03.058 | ||
Plain Text | Soueidan, M., Roumié, M., Nsouli, B. (2017) PIXE detection limit for aluminium thin film deposited on Si-based matrix. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 406. 71-74 doi:10.1016/j.nimb.2017.03.058 | ||
In | (2017) Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 406. Elsevier BV |
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