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Kot, Małgorzata, Das, Chittaranjan, Henkel, Karsten, Wojciechowski, Konrad, Snaith, Henry J., Schmeisser, Dieter (2017) Room temperature atomic layer deposited Al 2 O 3 on CH 3 NH 3 PbI 3 characterized by synchrotron-based X-ray photoelectron spectroscopy. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 411. 49-52 doi:10.1016/j.nimb.2017.01.082

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Reference TypeJournal (article/letter/editorial)
TitleRoom temperature atomic layer deposited Al 2 O 3 on CH 3 NH 3 PbI 3 characterized by synchrotron-based X-ray photoelectron spectroscopy
JournalNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
AuthorsKot, MałgorzataAuthor
Das, ChittaranjanAuthor
Henkel, KarstenAuthor
Wojciechowski, KonradAuthor
Snaith, Henry J.Author
Schmeisser, DieterAuthor
Year2017 (November)Volume411
PublisherElsevier BV
DOIdoi:10.1016/j.nimb.2017.01.082Search in ResearchGate
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Mindat Ref. ID5655281Long-form Identifiermindat:1:5:5655281:4
GUID0
Full ReferenceKot, Małgorzata, Das, Chittaranjan, Henkel, Karsten, Wojciechowski, Konrad, Snaith, Henry J., Schmeisser, Dieter (2017) Room temperature atomic layer deposited Al 2 O 3 on CH 3 NH 3 PbI 3 characterized by synchrotron-based X-ray photoelectron spectroscopy. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 411. 49-52 doi:10.1016/j.nimb.2017.01.082
Plain TextKot, Małgorzata, Das, Chittaranjan, Henkel, Karsten, Wojciechowski, Konrad, Snaith, Henry J., Schmeisser, Dieter (2017) Room temperature atomic layer deposited Al 2 O 3 on CH 3 NH 3 PbI 3 characterized by synchrotron-based X-ray photoelectron spectroscopy. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 411. 49-52 doi:10.1016/j.nimb.2017.01.082
In(2017) Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 411. Elsevier BV

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