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Slodzian, Georges, Wu, Ting-Di, Duprat, Jean, Engrand, Cécile, Guerquin-Kern, Jean-Luc (2017) Dynamic transfer applied to secondary ion imaging over large scanned fields with the nanoSIMS 50 at high mass resolution. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 412. 123-173 doi:10.1016/j.nimb.2017.06.019

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Reference TypeJournal (article/letter/editorial)
TitleDynamic transfer applied to secondary ion imaging over large scanned fields with the nanoSIMS 50 at high mass resolution
JournalNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
AuthorsSlodzian, GeorgesAuthor
Wu, Ting-DiAuthor
Duprat, JeanAuthor
Engrand, CécileAuthor
Guerquin-Kern, Jean-LucAuthor
Year2017 (December)Volume412
PublisherElsevier BV
DOIdoi:10.1016/j.nimb.2017.06.019Search in ResearchGate
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Mindat Ref. ID5655321Long-form Identifiermindat:1:5:5655321:1
GUID0
Full ReferenceSlodzian, Georges, Wu, Ting-Di, Duprat, Jean, Engrand, Cécile, Guerquin-Kern, Jean-Luc (2017) Dynamic transfer applied to secondary ion imaging over large scanned fields with the nanoSIMS 50 at high mass resolution. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 412. 123-173 doi:10.1016/j.nimb.2017.06.019
Plain TextSlodzian, Georges, Wu, Ting-Di, Duprat, Jean, Engrand, Cécile, Guerquin-Kern, Jean-Luc (2017) Dynamic transfer applied to secondary ion imaging over large scanned fields with the nanoSIMS 50 at high mass resolution. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 412. 123-173 doi:10.1016/j.nimb.2017.06.019
In(2017) Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 412. Elsevier BV

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