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Salter, W J M (1968) An examination of quantitative electron-probe microanalysis accuracy. Journal of Physics D: Applied Physics, 1. 541-547 doi:10.1088/0022-3727/1/5/302

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Reference TypeJournal (article/letter/editorial)
TitleAn examination of quantitative electron-probe microanalysis accuracy
JournalJournal of Physics D: Applied Physics
AuthorsSalter, W J MAuthor
Year1968 (May 1)Volume1
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/1/5/302Search in ResearchGate
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Mindat Ref. ID5656317Long-form Identifiermindat:1:5:5656317:5
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Full ReferenceSalter, W J M (1968) An examination of quantitative electron-probe microanalysis accuracy. Journal of Physics D: Applied Physics, 1. 541-547 doi:10.1088/0022-3727/1/5/302
Plain TextSalter, W J M (1968) An examination of quantitative electron-probe microanalysis accuracy. Journal of Physics D: Applied Physics, 1. 541-547 doi:10.1088/0022-3727/1/5/302
In(1968) Journal of Physics D: Applied Physics Vol. 1. IOP Publishing

See Also

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Philibert, J, Tixier, R (1968) Electron penetration and the atomic number correction in electron probe microanalysis. Journal of Physics D: Applied Physics, 1. 685-694 doi:10.1088/0022-3727/1/6/302
Andersen, C A, Wittry, D B (1968) An evaluation of absorption correction functions for electron probe microanalysis. Journal of Physics D: Applied Physics, 1. 529-540 doi:10.1088/0022-3727/1/5/301
Marshall, D J, Hall, T A (1968) Electron-probe X-ray microanalysis of thin films. Journal of Physics D: Applied Physics, 1. 1651-1656 doi:10.1088/0022-3727/1/12/310
Friskney, C A, Haworth, C W (1968) Electron probe microanalysis of metal oxides: comparison of correction methods. Journal of Physics D: Applied Physics, 1. 1590 doi:10.1088/0022-3727/1/11/531
Friskney, C A, Haworth, C W (1968) Electron probe microanalysis of metal oxides: comparison of correction methods. Journal of Physics D: Applied Physics, 1. 873-879 doi:10.1088/0022-3727/1/7/308
Bishop, H E (1968) The absorption and atomic number corrections in electron-probe X-ray microanalysis. Journal of Physics D: Applied Physics, 1. 673-684 doi:10.1088/0022-3727/1/6/301
Reed, S J B (1972) Comments on `An investigation of electron probe microanalysis corrections in nickel-cobalt alloys'. Journal of Physics D: Applied Physics, 5. doi:10.1088/0022-3727/5/2/101
Cazaux, J (2011) Angle-resolved electron probe microanalysis revisited. Journal of Physics D: Applied Physics, 44. 355502pp. doi:10.1088/0022-3727/44/35/355502
Love, G, Scott, V D (1978) Evaluation of a new correction procedure for quantitative electron probe microanalysis. Journal of Physics D: Applied Physics, 11. 1369-1376 doi:10.1088/0022-3727/11/10/002
Reed, S J B (1971) The backscattering correction for quantitative electron probe microanalysis with electrons incident at 45$deg$. Journal of Physics D: Applied Physics, 4. 1910-1912 doi:10.1088/0022-3727/4/12/312
Love, G, Cox, M G, Scott, V D (1978) A versatile atomic number correction for electron-probe microanalysis. Journal of Physics D: Applied Physics, 11. 7-21 doi:10.1088/0022-3727/11/1/004
 
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