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Cole, R S, Jennings, J C E (1971) An electron beam spectrometer for the measurement of the angular distribution of plasma losses in thin films. Journal of Physics D: Applied Physics, 4. 54-63 doi:10.1088/0022-3727/4/1/308

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Reference TypeJournal (article/letter/editorial)
TitleAn electron beam spectrometer for the measurement of the angular distribution of plasma losses in thin films
JournalJournal of Physics D: Applied Physics
AuthorsCole, R SAuthor
Jennings, J C EAuthor
Year1971 (January 1)Volume4
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/4/1/308Search in ResearchGate
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Mindat Ref. ID5657533Long-form Identifiermindat:1:5:5657533:8
GUID0
Full ReferenceCole, R S, Jennings, J C E (1971) An electron beam spectrometer for the measurement of the angular distribution of plasma losses in thin films. Journal of Physics D: Applied Physics, 4. 54-63 doi:10.1088/0022-3727/4/1/308
Plain TextCole, R S, Jennings, J C E (1971) An electron beam spectrometer for the measurement of the angular distribution of plasma losses in thin films. Journal of Physics D: Applied Physics, 4. 54-63 doi:10.1088/0022-3727/4/1/308
In(1971) Journal of Physics D: Applied Physics Vol. 4. IOP Publishing

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Lloyd, O (1971) Beam-plasma interactions in a hollow cathode. Journal of Physics D: Applied Physics, 4. 1291-1301 doi:10.1088/0022-3727/4/9/308
Misell, D L, Crick, R A (1971) An estimate of the effect of chromatic aberration in electron microscopy. Journal of Physics D: Applied Physics, 4. 1668-1674 doi:10.1088/0022-3727/4/11/308
Cole, R. S., Jennings, J. C. E. (1970) A Method for the Measurement of Scattering Angle in an Electron Beam Spectrometer. Review of Scientific Instruments, 41 (5). 711-712 doi:10.1063/1.1684624
Philibert, J, Rivory, J, Bryckaert, D, Tixier, R (1971) Electron probe microanalysis on electron microscope thin foils using thin standards. Journal of Physics D: Applied Physics, 4. 611 doi:10.1088/0022-3727/4/4/520
Egerton, R F, Rossouw, C J (1976) Direct measurement of contamination and etching rates in an electron beam. Journal of Physics D: Applied Physics, 9. 659-663 doi:10.1088/0022-3727/9/4/016
Simmons, J G (1971) Conduction in thin dielectric films. Journal of Physics D: Applied Physics, 4. 613-657 doi:10.1088/0022-3727/4/5/202
Seebold, R J A, Rhodes, R G (1971) Induced ac losses in an enhanced Meissner state. Journal of Physics D: Applied Physics, 4. 354-355 doi:10.1088/0022-3727/4/2/426
McDonald, I R, Lamki, A M, Delaney, C F G (1971) The attenuation and backscattering of electron beams by thin films. Journal of Physics D: Applied Physics, 4. 1210-1217 doi:10.1088/0022-3727/4/8/324
Grundy, P J, Tebble, R S, Hothersall, D C (1971) Cylindrical domains observed in thin cobalt crystals. Journal of Physics D: Applied Physics, 4. 174-177 doi:10.1088/0022-3727/4/1/425
Hill, J S (1971) Interferometric thickness measurements on transparent thin films. Journal of Physics D: Applied Physics, 4. 741-747 doi:10.1088/0022-3727/4/6/302
Wheeler, C B (1971) The high-power constricted plasma discharge column II. Experimental investigation. Journal of Physics D: Applied Physics, 4. 400-407 doi:10.1088/0022-3727/4/3/308
 
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