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Heslop, C J, Ward, E W (1971) The measurement of p - n junction depths using a scanning electron microscope. Journal of Physics D: Applied Physics, 4. 2039-2040 doi:10.1088/0022-3727/4/12/330

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Reference TypeJournal (article/letter/editorial)
TitleThe measurement of p - n junction depths using a scanning electron microscope
JournalJournal of Physics D: Applied Physics
AuthorsHeslop, C JAuthor
Ward, E WAuthor
Year1971 (December 1)Volume4
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/4/12/330Search in ResearchGate
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Mindat Ref. ID5657737Long-form Identifiermindat:1:5:5657737:2
GUID0
Full ReferenceHeslop, C J, Ward, E W (1971) The measurement of p - n junction depths using a scanning electron microscope. Journal of Physics D: Applied Physics, 4. 2039-2040 doi:10.1088/0022-3727/4/12/330
Plain TextHeslop, C J, Ward, E W (1971) The measurement of p - n junction depths using a scanning electron microscope. Journal of Physics D: Applied Physics, 4. 2039-2040 doi:10.1088/0022-3727/4/12/330
In(1971) Journal of Physics D: Applied Physics Vol. 4. IOP Publishing

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Moncrieff, D A, Barker, P R, Robinson, V N E (1979) Electron scattering by gas in the scanning electron microscope. Journal of Physics D: Applied Physics, 12. 481-488 doi:10.1088/0022-3727/12/4/005
Philibert, J, Rivory, J, Bryckaert, D, Tixier, R (1971) Electron probe microanalysis on electron microscope thin foils using thin standards. Journal of Physics D: Applied Physics, 4. 611 doi:10.1088/0022-3727/4/4/520
Gopinath, A, Savasse, T de Monts de (1971) On scanning electron microscope conduction-mode signals in bulk semiconductor devices: annular geometry. Journal of Physics D: Applied Physics, 4. 2031-2038 doi:10.1088/0022-3727/4/12/329
Osborn, J S (1971) A scanning electron microscope test procedure. Journal of Physics E: Scientific Instruments, 4 (12). 958-960 doi:10.1088/0022-3735/4/12/007
Bellau, R V, Chanter, R A, Dargan, C L (1971) Activation of a multi-emitter silicon carbide p-n junction cold cathode. Journal of Physics D: Applied Physics, 4. 2022-2030 doi:10.1088/0022-3727/4/12/328
Singh, O, Curzon, A E, Koch, C C (1976) Direct observation of the flux distribution in the mixed state of V-Ga alloys using a scanning electron microscope. Journal of Physics D: Applied Physics, 9. 611-613 doi:10.1088/0022-3727/9/4/011
Rishton, S A, Beaumont, S P, Wilkinson, C D W (1984) Measurement of the profile of finely focused electron beams in a scanning electron microscope. Journal of Physics E: Scientific Instruments, 17 (4). 296-303 doi:10.1088/0022-3735/17/4/011
Elliott, D J Herrell and P J (1971) Measurement of the fringing field of a magnetic recording head using an electron microscope. Journal of Physics E: Scientific Instruments, 4 (8). 567-570 doi:10.1088/0022-3735/4/8/004
lsanger, C C, Secker, P E (1971) Arc cathode current density measurements. Journal of Physics D: Applied Physics, 4. 1940-1945 doi:10.1088/0022-3727/4/12/315
Flemming, J P (1971) Voltage measurement using the scanning low energy electron probe (SLEEP). Journal of Physics E: Scientific Instruments, 4 (10). 743-746 doi:10.1088/0022-3735/4/10/008
Kanari, P S, Singh, V B, Nanda, J N (1971) Photoluminescence in ZnS (Cu, Mn) phosphors. Journal of Physics D: Applied Physics, 4. 1824-1829 doi:10.1088/0022-3727/4/11/330
 
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