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Sengupta, S P, De, M (1971) On the instrumental broadening correction in integral breadth analysis of x-ray line profiles from cold-worked alloys. Journal of Physics D: Applied Physics, 4. 1063-1065 doi:10.1088/0022-3727/4/7/425

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Reference TypeJournal (article/letter/editorial)
TitleOn the instrumental broadening correction in integral breadth analysis of x-ray line profiles from cold-worked alloys
JournalJournal of Physics D: Applied Physics
AuthorsSengupta, S PAuthor
De, MAuthor
Year1971 (July 1)Volume4
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/4/7/425Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5658013Long-form Identifiermindat:1:5:5658013:6
GUID0
Full ReferenceSengupta, S P, De, M (1971) On the instrumental broadening correction in integral breadth analysis of x-ray line profiles from cold-worked alloys. Journal of Physics D: Applied Physics, 4. 1063-1065 doi:10.1088/0022-3727/4/7/425
Plain TextSengupta, S P, De, M (1971) On the instrumental broadening correction in integral breadth analysis of x-ray line profiles from cold-worked alloys. Journal of Physics D: Applied Physics, 4. 1063-1065 doi:10.1088/0022-3727/4/7/425
In(1971) Journal of Physics D: Applied Physics Vol. 4. IOP Publishing

See Also

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Chatterjee, S K, Gupta, S P Sen (1972) Some further considerations of the instrumental broadening correction in integral breadth analysis of cold-worked alloys. Journal of Physics D: Applied Physics, 5. 1650-1653 doi:10.1088/0022-3727/5/9/320
Chatterjee, S K, Gupta, S P Sen (1972) An integral breadth analysis for particle size and strain determinations in cold-worked FCC alloys. Journal of Physics D: Applied Physics, 5. 609-612 doi:10.1088/0022-3727/5/3/323
Lewis, D, Northwood, D O (1969) Evaluation of crystallite size and microstrains in cold-worked lithium fluoride from X-ray diffraction line profiles. Journal of Physics D: Applied Physics, 2. 21-26 doi:10.1088/0022-3727/2/1/305
Nandi, R K, Gupta, S P Sen (1976) The application of the convolution relations in X-ray line breadth analysis. II. Journal of Physics D: Applied Physics, 9. 593-600 doi:10.1088/0022-3727/9/4/008
Nandi, R K, Gupta, S P Sen (1976) The application of the convolution relations in the X-ray line breadth analysis. III. Journal of Physics D: Applied Physics, 9. 601-605 doi:10.1088/0022-3727/9/4/009
Nandi, R K, Gupta, S P Sen (1975) The application of the convolution relations in the X-ray line breadth analysis. I. Journal of Physics D: Applied Physics, 8. 731-737 doi:10.1088/0022-3727/8/7/005
Pratap, R., Gupta, R. K. (1972) Integral-breadth analysis of X-ray line broadening in cold-worked natural molybdenite (MoS2) crystals. physica status solidi (a), 9 (2). 415-421 doi:10.1002/pssa.2210090203
Willder, S S (1971) The correction of deflection astigmatism in microspot cathode ray tubes. Journal of Physics D: Applied Physics, 4. 27-38 doi:10.1088/0022-3727/4/1/305
Nayyar, V P (1971) Theory of spectral line profile analysis with reflection echelon. Journal of Physics D: Applied Physics, 4. 489-493 doi:10.1088/0022-3727/4/4/303
Halder, S K, Chatterjee, S K, Gupta, S P Sen (1973) Voigt profile analysis for particle size and strain determinations in cold-worked FCC alloys from a single reflection. Journal of Physics D: Applied Physics, 6. 1555-1559 doi:10.1088/0022-3727/6/13/304
Durá, O J, López de la Torre, M A (2008) X-ray diffraction line profile analysis of mechanically alloyed nanocrystalline YSZ. Journal of Physics D: Applied Physics, 41. 45408pp. doi:10.1088/0022-3727/41/4/045408
 
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