Belmont, M R, Secker, P E (1972) The dependence on trace impurities of the observed carrier mobilities in n-hexane. Journal of Physics D: Applied Physics, 5. 2212-2214 doi:10.1088/0022-3727/5/12/310
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | The dependence on trace impurities of the observed carrier mobilities in n-hexane | ||
Journal | Journal of Physics D: Applied Physics | ||
Authors | Belmont, M R | Author | |
Secker, P E | Author | ||
Year | 1972 (December 1) | Volume | 5 |
Publisher | IOP Publishing | ||
DOI | doi:10.1088/0022-3727/5/12/310Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5658306 | Long-form Identifier | mindat:1:5:5658306:3 |
GUID | 0 | ||
Full Reference | Belmont, M R, Secker, P E (1972) The dependence on trace impurities of the observed carrier mobilities in n-hexane. Journal of Physics D: Applied Physics, 5. 2212-2214 doi:10.1088/0022-3727/5/12/310 | ||
Plain Text | Belmont, M R, Secker, P E (1972) The dependence on trace impurities of the observed carrier mobilities in n-hexane. Journal of Physics D: Applied Physics, 5. 2212-2214 doi:10.1088/0022-3727/5/12/310 | ||
In | (1972) Journal of Physics D: Applied Physics Vol. 5. IOP Publishing |
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