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Kanaya, K, Ono, S (1976) Consistent theory of electron scattering with atoms in electron microscopes. Journal of Physics D: Applied Physics, 9. 161-174 doi:10.1088/0022-3727/9/2/006

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Reference TypeJournal (article/letter/editorial)
TitleConsistent theory of electron scattering with atoms in electron microscopes
JournalJournal of Physics D: Applied Physics
AuthorsKanaya, KAuthor
Ono, SAuthor
Year1976 (February 1)Volume9
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/9/2/006Search in ResearchGate
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Mindat Ref. ID5659725Long-form Identifiermindat:1:5:5659725:1
GUID0
Full ReferenceKanaya, K, Ono, S (1976) Consistent theory of electron scattering with atoms in electron microscopes. Journal of Physics D: Applied Physics, 9. 161-174 doi:10.1088/0022-3727/9/2/006
Plain TextKanaya, K, Ono, S (1976) Consistent theory of electron scattering with atoms in electron microscopes. Journal of Physics D: Applied Physics, 9. 161-174 doi:10.1088/0022-3727/9/2/006
In(1976) Journal of Physics D: Applied Physics Vol. 9. IOP Publishing

See Also

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Kanaya, K, Ono, S, Ishigaki, F (1978) Secondary electron emission from insulators. Journal of Physics D: Applied Physics, 11. 2425-2437 doi:10.1088/0022-3727/11/17/015
Kanaya, K, Ono, S (1978) The energy dependence of a diffusion model of an electron probe into solid targets. Journal of Physics D: Applied Physics, 11. 1495-1498 doi:10.1088/0022-3727/11/11/008
Kanaya, K, Kawakatsu, H (1972) Secondary electron emission due to primary and backscattered electrons. Journal of Physics D: Applied Physics, 5. 1727-1742 doi:10.1088/0022-3727/5/9/330
Chang, Jen-Shih (1976) The electron temperature in a positive column with volume recombination. Journal of Physics D: Applied Physics, 9. doi:10.1088/0022-3727/9/12/001
Misell, D L (1976) On the validity of the weak-phase and other approximations in the analysis of electron microscope images. Journal of Physics D: Applied Physics, 9. 1849-1866 doi:10.1088/0022-3727/9/13/006
Krakow, W, Welles, K B, Siegel, B M (1976) Image processing of dark-field electron micrographs. Journal of Physics D: Applied Physics, 9. 175-181 doi:10.1088/0022-3727/9/2/007
Atkinson, R, Jones, G A (1976) Domain observation in MnBi films with the scanning electron microscope. Journal of Physics D: Applied Physics, 9. doi:10.1088/0022-3727/9/11/004
Williams, M M R (1976) The time-energy distribution of atoms in a radiation damage cascade. Journal of Physics D: Applied Physics, 9. 2463-2470 doi:10.1088/0022-3727/9/17/006
Zanchi, G, Sevely, J, Jouffrey, B (1980) Filtered electron image contrast in amorphous objects. I. Elastic scattering. Journal of Physics D: Applied Physics, 13. 1589-1604 doi:10.1088/0022-3727/13/9/006
Howorth, J R (1976) Transmission silicon photoemitters and electron multipliers. Journal of Physics D: Applied Physics, 9. 2169 doi:10.1088/0022-3727/9/14/526
Taylor, D M (1976) Electron-beam charging of polyethylene terephthalate films. Journal of Physics D: Applied Physics, 9. 2269-2279 doi:10.1088/0022-3727/9/15/018
 
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