Pandey, D, Krishna, P (1977) X-ray diffraction study of stacking faults in a single crystal of 2H SiC. Journal of Physics D: Applied Physics, 10. 2057-2068 doi:10.1088/0022-3727/10/15/009
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | X-ray diffraction study of stacking faults in a single crystal of 2H SiC | ||
Journal | Journal of Physics D: Applied Physics | ||
Authors | Pandey, D | Author | |
Krishna, P | Author | ||
Year | 1977 (October 21) | Volume | 10 |
Publisher | IOP Publishing | ||
DOI | doi:10.1088/0022-3727/10/15/009Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5659983 | Long-form Identifier | mindat:1:5:5659983:3 |
GUID | 0 | ||
Full Reference | Pandey, D, Krishna, P (1977) X-ray diffraction study of stacking faults in a single crystal of 2H SiC. Journal of Physics D: Applied Physics, 10. 2057-2068 doi:10.1088/0022-3727/10/15/009 | ||
Plain Text | Pandey, D, Krishna, P (1977) X-ray diffraction study of stacking faults in a single crystal of 2H SiC. Journal of Physics D: Applied Physics, 10. 2057-2068 doi:10.1088/0022-3727/10/15/009 | ||
In | (1977) Journal of Physics D: Applied Physics Vol. 10. IOP Publishing |
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