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Huiser, A M J, Toorn, P van (1982) Optimal detection in scanning electron microscopy. Journal of Physics D: Applied Physics, 15. 747-755 doi:10.1088/0022-3727/15/5/005

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Reference TypeJournal (article/letter/editorial)
TitleOptimal detection in scanning electron microscopy
JournalJournal of Physics D: Applied Physics
AuthorsHuiser, A M JAuthor
Toorn, P vanAuthor
Year1982 (May 14)Volume15
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/15/5/005Search in ResearchGate
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Mindat Ref. ID5661520Long-form Identifiermindat:1:5:5661520:1
GUID0
Full ReferenceHuiser, A M J, Toorn, P van (1982) Optimal detection in scanning electron microscopy. Journal of Physics D: Applied Physics, 15. 747-755 doi:10.1088/0022-3727/15/5/005
Plain TextHuiser, A M J, Toorn, P van (1982) Optimal detection in scanning electron microscopy. Journal of Physics D: Applied Physics, 15. 747-755 doi:10.1088/0022-3727/15/5/005
In(1982) Journal of Physics D: Applied Physics Vol. 15. IOP Publishing

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Bond, J W (1982) An improvement in the resolution of trochoidal electron monochromators. Journal of Physics D: Applied Physics, 15. 1843-1848 doi:10.1088/0022-3727/15/10/005
Hothersall, D C, Jones, G A, Grundy, P J (1972) The detection of bubble domains in YFeO3 by scanning electron microscopy. Journal of Physics D: Applied Physics, 5. 440-442 doi:10.1088/0022-3727/5/2/325
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Brooks, H L, Cornell, M C, Fletcher, J, Littlewood, I M, Nygaard, K J (1982) Electron drift velocities in xenon. Journal of Physics D: Applied Physics, 15. doi:10.1088/0022-3727/15/6/002
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