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Prudenziati, M, Morten, B, Moro, L, Olumekor, L, Tombesi, A (1986) Interactions between thick-film resistors and terminations: the role of bismuth. Journal of Physics D: Applied Physics, 19. 275-282 doi:10.1088/0022-3727/19/2/014

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Reference TypeJournal (article/letter/editorial)
TitleInteractions between thick-film resistors and terminations: the role of bismuth
JournalJournal of Physics D: Applied Physics
AuthorsPrudenziati, MAuthor
Morten, BAuthor
Moro, LAuthor
Olumekor, LAuthor
Tombesi, AAuthor
Year1986 (February 14)Volume19
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/19/2/014Search in ResearchGate
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Mindat Ref. ID5662610Long-form Identifiermindat:1:5:5662610:0
GUID0
Full ReferencePrudenziati, M, Morten, B, Moro, L, Olumekor, L, Tombesi, A (1986) Interactions between thick-film resistors and terminations: the role of bismuth. Journal of Physics D: Applied Physics, 19. 275-282 doi:10.1088/0022-3727/19/2/014
Plain TextPrudenziati, M, Morten, B, Moro, L, Olumekor, L, Tombesi, A (1986) Interactions between thick-film resistors and terminations: the role of bismuth. Journal of Physics D: Applied Physics, 19. 275-282 doi:10.1088/0022-3727/19/2/014
In(1986) Journal of Physics D: Applied Physics Vol. 19. IOP Publishing

See Also

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Prudenziati, M, Morten, B, Masoero, A (1981) Excess noise and refiring processes in thick-film resistors. Journal of Physics D: Applied Physics, 14. 1355-1362 doi:10.1088/0022-3727/14/7/024
Morten, B, Masoero, A, Prudenziati, M, Manfredini, T (1994) Evolution of ruthenate-based thick film cermet resistors. Journal of Physics D: Applied Physics, 27. 2227-2235 doi:10.1088/0022-3727/27/10/037
Kubovy, A (1986) A percolation model of the conduction threshold in thick-film resistors: segregated structures. Journal of Physics D: Applied Physics, 19. 2171-2183 doi:10.1088/0022-3727/19/11/014
Masoero, A, Rietto, A M, Morten, B, Prudenziati, M (1983) Excess noise and its temperature dependence in thick-film (cermet) resistors. Journal of Physics D: Applied Physics, 16. 669-674 doi:10.1088/0022-3727/16/4/027
Morten, B, Prudenziati, M, Taroni, A (1979) Strain sensitivity in film and cermet resistors: measured and physical quantities. Journal of Physics D: Applied Physics, 12. doi:10.1088/0022-3727/12/5/003
Moro, L., Lazzeri, P., Prudenziati, M., Morten, B., Savigni, P. (1992) Interactions between beryllia and high‐lead glasses. Applied Physics Letters, 61 (19). 2299-2301 doi:10.1063/1.108270
Tankiewicz, S., Morten, B., Prudenziati, M., Golonka, L. J. (2002) IrO2-based thick-film resistors. Journal of Applied Physics, 91 (7). 4261-4266 doi:10.1063/1.1454223
Canali, C., Malavasi, D., Morten, B., Prudenziati, M., Taroni, A. (1980) Piezoresistive effects in thick‐film resistors. Journal of Applied Physics, 51 (6). 3282-3288 doi:10.1063/1.328035
Alessandrini, A., Valdrè, G., Morten, B., Prudenziati, M. (2002) Electric force microscopy investigation of the microstructure of thick film resistors. Journal of Applied Physics, 92 (8). 4705-4711 doi:10.1063/1.1506188
Morten, B., Prudenziati, M., Sacchi, M., Sirotti, F. (1988) Phase transitions in Ru based thick‐film (cermet) resistors. Journal of Applied Physics, 63 (7). 2267-2271 doi:10.1063/1.341119
Walpole, L J (1986) The elastic shear moduli of a cubic crystal. Journal of Physics D: Applied Physics, 19. 457-462 doi:10.1088/0022-3727/19/3/014
 
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