Bichsel, R, Levy, F (1986) Influence of process conditions on the electrical and optical properties of RF magnetron sputtered MoS2films. Journal of Physics D: Applied Physics, 19. 1809-1819 doi:10.1088/0022-3727/19/9/025
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Influence of process conditions on the electrical and optical properties of RF magnetron sputtered MoS2films | ||
Journal | Journal of Physics D: Applied Physics | ||
Authors | Bichsel, R | Author | |
Levy, F | Author | ||
Year | 1986 (September 14) | Volume | 19 |
Publisher | IOP Publishing | ||
DOI | doi:10.1088/0022-3727/19/9/025Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5662783 | Long-form Identifier | mindat:1:5:5662783:5 |
GUID | 0 | ||
Full Reference | Bichsel, R, Levy, F (1986) Influence of process conditions on the electrical and optical properties of RF magnetron sputtered MoS2films. Journal of Physics D: Applied Physics, 19. 1809-1819 doi:10.1088/0022-3727/19/9/025 | ||
Plain Text | Bichsel, R, Levy, F (1986) Influence of process conditions on the electrical and optical properties of RF magnetron sputtered MoS2films. Journal of Physics D: Applied Physics, 19. 1809-1819 doi:10.1088/0022-3727/19/9/025 | ||
In | (1986) Journal of Physics D: Applied Physics Vol. 19. IOP Publishing |
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