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Fewster, P F, Andrew, N L (1995) Applications of multiple-crystal diffractometry. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/019

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Reference TypeJournal (article/letter/editorial)
TitleApplications of multiple-crystal diffractometry
JournalJournal of Physics D: Applied Physics
AuthorsFewster, P FAuthor
Andrew, N LAuthor
Year1995 (April 14)Volume28
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/28/4a/019Search in ResearchGate
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Mindat Ref. ID5665787Long-form Identifiermindat:1:5:5665787:2
GUID0
Full ReferenceFewster, P F, Andrew, N L (1995) Applications of multiple-crystal diffractometry. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/019
Plain TextFewster, P F, Andrew, N L (1995) Applications of multiple-crystal diffractometry. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/019
In(1995) Journal of Physics D: Applied Physics Vol. 28. IOP Publishing

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Kidd, P, Fewster, P F, Andrew, N L (1995) Interpretation of the diffraction profile resulting from strain relaxation in epilayers. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/026
Hart, L, Fewster, P F, Ashwin, M J, Fahy, M R, Newman, R (1995) Measurement of interface roughness in a superlattice of delta-barriers of Al in GaAs using high-resolution X-ray diffractometry. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/030
Argunova, T S, Kyutt, R N, Scheglov, M P, Faleev, N N (1995) Determination of YBaCuO thin layer structural parameters by using high-resolution X-ray diffractometry. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/041
Tapfer, L, Sciacovelli, P, Caro, L De (1995) Double- and triple-crystal X-ray diffraction analysis of semiconductor quantum wires. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/035
Iberl, A, Gobel, H, Heinecke, H (1995) Characterization of Ill-V heterostructures grown by selective-area epitaxy using double-crystal X-ray diffractometry with high lateral resolution. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/034
Hildebrandt, G (1995) Early experimental proofs of the dynamical theory. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/002
Francesio, L, Franzosi, P, Landgren, G (1995) A high-resolution X-ray diffraction study in InGaAs/InP superlattices. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/033
Fewster, P F (1993) Characterization of quantum wells by X-ray diffraction. Journal of Physics D: Applied Physics, 26. doi:10.1088/0022-3727/26/4a/030
Ishikawa, T (1995) High-resolution X-ray optics for third-generation synchrotron radiation. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/050
Lukas, P, Alefeld, B, Ioffe, A, Mikula, P, Vrana, M (1995) Topography in coherent beams of a neutron interferometer. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/017
Boer, D K G De, Leenaers, A J G, Wolf, R M (1995) Journal of Physics D: Applied Physics, 28. IOP Publishing. doi:10.1088/0022-3727/28/4a/044
 
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