Khludkov, S S, Stepanov, V E, Tolbanov, O P (1996) Radiation hardness of semiconductor detectors for high-energy physics. Journal of Physics D: Applied Physics, 29. 1559-1563 doi:10.1088/0022-3727/29/6/022
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Radiation hardness of semiconductor detectors for high-energy physics | ||
Journal | Journal of Physics D: Applied Physics | ||
Authors | Khludkov, S S | Author | |
Stepanov, V E | Author | ||
Tolbanov, O P | Author | ||
Year | 1996 (June 14) | Volume | 29 |
Publisher | IOP Publishing | ||
DOI | doi:10.1088/0022-3727/29/6/022Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5666301 | Long-form Identifier | mindat:1:5:5666301:3 |
GUID | 0 | ||
Full Reference | Khludkov, S S, Stepanov, V E, Tolbanov, O P (1996) Radiation hardness of semiconductor detectors for high-energy physics. Journal of Physics D: Applied Physics, 29. 1559-1563 doi:10.1088/0022-3727/29/6/022 | ||
Plain Text | Khludkov, S S, Stepanov, V E, Tolbanov, O P (1996) Radiation hardness of semiconductor detectors for high-energy physics. Journal of Physics D: Applied Physics, 29. 1559-1563 doi:10.1088/0022-3727/29/6/022 | ||
In | (1996) Journal of Physics D: Applied Physics Vol. 29. IOP Publishing |
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