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Dziedzic, Andrzej, Kolek, Andrzej (1998) noise in polymer thick-film resistors. Journal of Physics D: Applied Physics, 31. 2091-2097 doi:10.1088/0022-3727/31/17/003

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Reference TypeJournal (article/letter/editorial)
Titlenoise in polymer thick-film resistors
JournalJournal of Physics D: Applied Physics
AuthorsDziedzic, AndrzejAuthor
Kolek, AndrzejAuthor
Year1998 (September 7)Volume31
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/31/17/003Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5667038Long-form Identifiermindat:1:5:5667038:7
GUID0
Full ReferenceDziedzic, Andrzej, Kolek, Andrzej (1998) noise in polymer thick-film resistors. Journal of Physics D: Applied Physics, 31. 2091-2097 doi:10.1088/0022-3727/31/17/003
Plain TextDziedzic, Andrzej, Kolek, Andrzej (1998) noise in polymer thick-film resistors. Journal of Physics D: Applied Physics, 31. 2091-2097 doi:10.1088/0022-3727/31/17/003
In(1998) Journal of Physics D: Applied Physics Vol. 31. IOP Publishing

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Kolek, A, Stadler, A W, Zawiślak, Z, Mleczko, K, Dziedzic, A (2008) Noise and switching phenomena in thick-film resistors. Journal of Physics D: Applied Physics, 41. 25303pp. doi:10.1088/0022-3727/41/2/025303
Stadler, Adam Witold, Kolek, Andrzej, Zawiślak, Zbigniew, Mleczko, Krzysztof, Jakubowska, Małgorzata, Kiełbasiński, Konrad Rafał, Młożniak, Anna (2010) Noise properties of Pb/Cd-free thick film resistors. Journal of Physics D: Applied Physics, 43. 265401pp. doi:10.1088/0022-3727/43/26/265401
Żak, Dariusz, Dziedzic, Andrzej, Kolek, Andrzej, Stadler, Adam W, Mleczko, Krzysztof, Szałański, Piotr, Zawiślak, Zbigniew (2006) Implementation of RuO2-glass based thick film resistors in cryogenic thermometry. Measurement Science and Technology, 17. 22-27 doi:10.1088/0957-0233/17/1/005
Kolek, A, Ptak, P, Dziedzic, A (2003) Noise characteristics of resistors buried in low-temperature co-fired ceramics. Journal of Physics D: Applied Physics, 36. 1009-1017 doi:10.1088/0022-3727/36/8/311
Prudenziati, M, Morten, B, Masoero, A (1981) Excess noise and refiring processes in thick-film resistors. Journal of Physics D: Applied Physics, 14. 1355-1362 doi:10.1088/0022-3727/14/7/024
Kaila, M M, Russell, G J (1998) A photo-thermoelectrical YBCO-BiSb thick film bolometer. Journal of Physics D: Applied Physics, 31. 1987-1990 doi:10.1088/0022-3727/31/16/007
Demokritov, S O (1998) Biquadratic interlayer coupling in layered magnetic systems. Journal of Physics D: Applied Physics, 31. 925-941 doi:10.1088/0022-3727/31/8/003
Abe, O, Taketa, Y (1991) Electrical conduction in thick film resistors. Journal of Physics D: Applied Physics, 24. 1163-1171 doi:10.1088/0022-3727/24/7/022
Papakostas, T V, White, N M (2000) Influence of substrate on the gauge factor of polymer thick-film resistors. Journal of Physics D: Applied Physics, 33. doi:10.1088/0022-3727/33/14/101
Ono, Hiroshi, Kowatari, Nozomu (1998) Simultaneous measurements of complex birefringence in azo dye doped polymer films induced by linearly polarized light. Journal of Physics D: Applied Physics, 31. 1511-1515 doi:10.1088/0022-3727/31/13/003
Masoero, A, Rietto, A M, Morten, B, Prudenziati, M (1983) Excess noise and its temperature dependence in thick-film (cermet) resistors. Journal of Physics D: Applied Physics, 16. 669-674 doi:10.1088/0022-3727/16/4/027
 
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