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Klad`ko, V P, Datsenko, L I, Bak-Misiuk, J, Olikhovskii, S I, Machulin, V F, Prokopenko, I V, Molodkin, V B, Maksimenko, Z V (2001) Calculation of two-dimensional maps of diffuse scattering by a real crystal with microdefects and comparison of results obtained from three-crystal diffractometry. Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/10a/318

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Reference TypeJournal (article/letter/editorial)
TitleCalculation of two-dimensional maps of diffuse scattering by a real crystal with microdefects and comparison of results obtained from three-crystal diffractometry
JournalJournal of Physics D: Applied Physics
AuthorsKlad`ko, V PAuthor
Datsenko, L IAuthor
Bak-Misiuk, JAuthor
Olikhovskii, S IAuthor
Machulin, V FAuthor
Prokopenko, I VAuthor
Molodkin, V BAuthor
Maksimenko, Z VAuthor
Year2001 (May 21)Volume34
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/34/10a/318Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5668468Long-form Identifiermindat:1:5:5668468:1
GUID0
Full ReferenceKlad`ko, V P, Datsenko, L I, Bak-Misiuk, J, Olikhovskii, S I, Machulin, V F, Prokopenko, I V, Molodkin, V B, Maksimenko, Z V (2001) Calculation of two-dimensional maps of diffuse scattering by a real crystal with microdefects and comparison of results obtained from three-crystal diffractometry. Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/10a/318
Plain TextKlad`ko, V P, Datsenko, L I, Bak-Misiuk, J, Olikhovskii, S I, Machulin, V F, Prokopenko, I V, Molodkin, V B, Maksimenko, Z V (2001) Calculation of two-dimensional maps of diffuse scattering by a real crystal with microdefects and comparison of results obtained from three-crystal diffractometry. Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/10a/318
In(2000) Journal of Physics D: Applied Physics Vol. 34. IOP Publishing

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Molodkin, V B, Olikhovskii, S I, Kislovskii, E N, Krivitsky, V P, Len', E G, Pervak, E V, Ice, G E, Larson, B C (2001) Double-crystal x-ray diffractometry of single crystals with microdefects. Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/10a/317
Shul'pina, I L, Astrova, E V, Ratnikov, V V, Remenyuk, A D, Tkachenko, A G (2001) Characterization of microchannel Si by HRXD and topography. Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/10a/329
Grigorian, S A, Vartanyants, I A, Kovalchuk, M V (2001) Surface and bulk contributions to x-ray thermal diffuse scattering (Green's function approach). Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/10a/316
Auleytner, J., Datsenko, L., Klad’ko, V., Machulin, V., Melnyk, V., Prokopenko, I., Bak-Misiuk, J., Misiuk, A. (1999) Influence of hydrostatic pressure at the temperatures about 1500 K on defect structure of Czochralski silicon. Journal of Alloys and Compounds, 286. 246-249 doi:10.1016/s0925-8388(98)01014-7
Molodkin, V. B., Olikhovskii, S. I., Kislovskii, E. N., Vladimirova, T. P., Skakunova, E. S., Seredenko, R. F., Sheludchenko, B. V. (2008) Dynamical theoretical model of the high-resolution double-crystal x-ray diffractometry of imperfect single crystals with microdefects. Physical Review B, 78 (22) doi:10.1103/physrevb.78.224109
Molodkin, V. B., Olikhovskii, S. I., Kislovskii, E. N., Fodchuk, I. M., Skakunova, E. S., Pervak, E. V., Molodkin, V. V. (2007) Dynamical theory of X-ray diffraction by multilayered structures with microdefects. physica status solidi (a), 204 (8). 2606-2612 doi:10.1002/pssa.200675686
Kochelab, V. V., Molodkin, V. B., Olikhovskii, S. I., Osinovskii, M. E. (1988) The thickness dependence of the X-ray diffuse scattering intensity for crystals with microdefects at laue-case diffraction. physica status solidi (a), 108 (1). 67-79 doi:10.1002/pssa.2211080103
Shevchenko, M B, Pobydaylo, O V, Molodkin, V B (2003) New investigation of the low asymmetric x-ray Bragg diffraction by a bent crystal. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/303
Vasyukov, D A, Baidakova, M V, Chaldyshev, V V, Suvorova, A A, Preobrazhenskii, V V, Putyato, M A, Semyagin, B R (2001) Structural transformations in low-temperature grown GaAs:Sb. Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/10a/304
Molodkin, V. B., Shpak, A. P., Kovalchuk, M. V., Nosik, V. L., Machulin, V. F. (2010) Diffuse-dynamic multiparameter diffractometry: A review. Crystallography Reports, 55 (7) 1122-1134 doi:10.1134/s1063774510070059
Artamonov, M F, Krasov, V I, Paperny, V L (2001) Generation of multiply charged ions from a cathode jet of a low-energy vacuum spark. Journal of Physics D: Applied Physics, 34. 3364-3367 doi:10.1088/0022-3727/34/23/307
 
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