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Ellmer, K (2001) Resistivity of polycrystalline zinc oxide films: current status and physical limit. Journal of Physics D: Applied Physics, 34. 3097-3108 doi:10.1088/0022-3727/34/21/301

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Reference TypeJournal (article/letter/editorial)
TitleResistivity of polycrystalline zinc oxide films: current status and physical limit
JournalJournal of Physics D: Applied Physics
AuthorsEllmer, KAuthor
Year2001 (November 7)Volume34
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/34/21/301Search in ResearchGate
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Mindat Ref. ID5668744Long-form Identifiermindat:1:5:5668744:8
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Full ReferenceEllmer, K (2001) Resistivity of polycrystalline zinc oxide films: current status and physical limit. Journal of Physics D: Applied Physics, 34. 3097-3108 doi:10.1088/0022-3727/34/21/301
Plain TextEllmer, K (2001) Resistivity of polycrystalline zinc oxide films: current status and physical limit. Journal of Physics D: Applied Physics, 34. 3097-3108 doi:10.1088/0022-3727/34/21/301
In(2000) Journal of Physics D: Applied Physics Vol. 34. IOP Publishing

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Topolov, V Yu, Bolten, D, Böttger, U, Waser, R (2001) Domain switching, rotation processes and dielectric response of polycrystalline Pb(ZrxTi1-x)O3thin films. Journal of Physics D: Applied Physics, 34. 711-716 doi:10.1088/0022-3727/34/5/308
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