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Poloucek, P, Pietsch, U, Geue, T, Symietz, Ch, Brezesinski, G (2001) X-ray reflectivity analysis of thin complex Langmuir-Blodgett films. Journal of Physics D: Applied Physics, 34. 450-458 doi:10.1088/0022-3727/34/4/302

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Reference TypeJournal (article/letter/editorial)
TitleX-ray reflectivity analysis of thin complex Langmuir-Blodgett films
JournalJournal of Physics D: Applied Physics
AuthorsPoloucek, PAuthor
Pietsch, UAuthor
Geue, TAuthor
Symietz, ChAuthor
Brezesinski, GAuthor
Year2001 (February 21)Volume34
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/34/4/302Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5668850Long-form Identifiermindat:1:5:5668850:8
GUID0
Full ReferencePoloucek, P, Pietsch, U, Geue, T, Symietz, Ch, Brezesinski, G (2001) X-ray reflectivity analysis of thin complex Langmuir-Blodgett films. Journal of Physics D: Applied Physics, 34. 450-458 doi:10.1088/0022-3727/34/4/302
Plain TextPoloucek, P, Pietsch, U, Geue, T, Symietz, Ch, Brezesinski, G (2001) X-ray reflectivity analysis of thin complex Langmuir-Blodgett films. Journal of Physics D: Applied Physics, 34. 450-458 doi:10.1088/0022-3727/34/4/302
In(2000) Journal of Physics D: Applied Physics Vol. 34. IOP Publishing

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