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Said, R A (2001) Enhanced pulse-sampling force probing for picosecond measurement of integrated circuits. Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/5/102

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Reference TypeJournal (article/letter/editorial)
TitleEnhanced pulse-sampling force probing for picosecond measurement of integrated circuits
JournalJournal of Physics D: Applied Physics
AuthorsSaid, R AAuthor
Year2001 (March 7)Volume34
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/34/5/102Search in ResearchGate
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Mindat Ref. ID5668878Long-form Identifiermindat:1:5:5668878:4
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Full ReferenceSaid, R A (2001) Enhanced pulse-sampling force probing for picosecond measurement of integrated circuits. Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/5/102
Plain TextSaid, R A (2001) Enhanced pulse-sampling force probing for picosecond measurement of integrated circuits. Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/5/102
In(2000) Journal of Physics D: Applied Physics Vol. 34. IOP Publishing

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