Lu, X B, Liu, Z G, Zhang, X, Huang, R, Zhou, H W, Wang, X P, Nguyen, Bich-Yen (2003) Investigation of high-quality ultra-thin LaAlO3films as high-kgate dielectrics. Journal of Physics D: Applied Physics, 36. 3047-3050 doi:10.1088/0022-3727/36/23/027
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Investigation of high-quality ultra-thin LaAlO3films as high-kgate dielectrics | ||
Journal | Journal of Physics D: Applied Physics | ||
Authors | Lu, X B | Author | |
Liu, Z G | Author | ||
Zhang, X | Author | ||
Huang, R | Author | ||
Zhou, H W | Author | ||
Wang, X P | Author | ||
Nguyen, Bich-Yen | Author | ||
Year | 2003 (December 7) | Volume | 36 |
Publisher | IOP Publishing | ||
DOI | doi:10.1088/0022-3727/36/23/027Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5669912 | Long-form Identifier | mindat:1:5:5669912:4 |
GUID | 0 | ||
Full Reference | Lu, X B, Liu, Z G, Zhang, X, Huang, R, Zhou, H W, Wang, X P, Nguyen, Bich-Yen (2003) Investigation of high-quality ultra-thin LaAlO3films as high-kgate dielectrics. Journal of Physics D: Applied Physics, 36. 3047-3050 doi:10.1088/0022-3727/36/23/027 | ||
Plain Text | Lu, X B, Liu, Z G, Zhang, X, Huang, R, Zhou, H W, Wang, X P, Nguyen, Bich-Yen (2003) Investigation of high-quality ultra-thin LaAlO3films as high-kgate dielectrics. Journal of Physics D: Applied Physics, 36. 3047-3050 doi:10.1088/0022-3727/36/23/027 | ||
In | (2002) Journal of Physics D: Applied Physics Vol. 36. IOP Publishing |
See Also
These are possibly similar items as determined by title/reference text matching only.