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Perea, D.E., Wijaya, E., Lensch-Falk, J.L., Hemesath, E.R., Lauhon, L.J. (2008) Tomographic analysis of dilute impurities in semiconductor nanostructures. Journal of Solid State Chemistry, 181. 1642-1649 doi:10.1016/j.jssc.2008.06.007

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Reference TypeJournal (article/letter/editorial)
TitleTomographic analysis of dilute impurities in semiconductor nanostructures
JournalJournal of Solid State Chemistry
AuthorsPerea, D.E.Author
Wijaya, E.Author
Lensch-Falk, J.L.Author
Hemesath, E.R.Author
Lauhon, L.J.Author
Year2008 (July)Volume181
PublisherElsevier BV
DOIdoi:10.1016/j.jssc.2008.06.007Search in ResearchGate
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Mindat Ref. ID589026Long-form Identifiermindat:1:5:589026:6
GUID0
Full ReferencePerea, D.E., Wijaya, E., Lensch-Falk, J.L., Hemesath, E.R., Lauhon, L.J. (2008) Tomographic analysis of dilute impurities in semiconductor nanostructures. Journal of Solid State Chemistry, 181. 1642-1649 doi:10.1016/j.jssc.2008.06.007
Plain TextPerea, D.E., Wijaya, E., Lensch-Falk, J.L., Hemesath, E.R., Lauhon, L.J. (2008) Tomographic analysis of dilute impurities in semiconductor nanostructures. Journal of Solid State Chemistry, 181. 1642-1649 doi:10.1016/j.jssc.2008.06.007
In(2008, July) Journal of Solid State Chemistry Vol. 181 (7) Elsevier BV

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Perea, D.E., Lensch, J.L., May, S.J., Wessels, B.W., Lauhon, L.J. (2006) Composition analysis of single semiconductor nanowires using pulsed-laser atom probe tomography. Applied Physics A, 85. 271-275 doi:10.1007/s00339-006-3710-1
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