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Vandervorst, W., Houghton, D. C., Shepherd, F. R., Swanson, M. L., Plattner, H. H., Carpenter, G. J. C. (1985) Residual damage in B+ and –implanted Si. Canadian Journal of Physics, 63. 863-869 doi:10.1139/p85-140

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Reference TypeJournal (article/letter/editorial)
TitleResidual damage in B+ and –implanted Si
JournalCanadian Journal of Physics
AuthorsVandervorst, W.Author
Houghton, D. C.Author
Shepherd, F. R.Author
Swanson, M. L.Author
Plattner, H. H.Author
Carpenter, G. J. C.Author
Year1985 (June 1)Volume63
PublisherCanadian Science Publishing
DOIdoi:10.1139/p85-140Search in ResearchGate
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Mindat Ref. ID5992013Long-form Identifiermindat:1:5:5992013:1
GUID0
Full ReferenceVandervorst, W., Houghton, D. C., Shepherd, F. R., Swanson, M. L., Plattner, H. H., Carpenter, G. J. C. (1985) Residual damage in B+ and –implanted Si. Canadian Journal of Physics, 63. 863-869 doi:10.1139/p85-140
Plain TextVandervorst, W., Houghton, D. C., Shepherd, F. R., Swanson, M. L., Plattner, H. H., Carpenter, G. J. C. (1985) Residual damage in B+ and –implanted Si. Canadian Journal of Physics, 63. 863-869 doi:10.1139/p85-140
In(n.d.) Canadian Journal of Physics Vol. 63. Canadian Science Publishing


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