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Li, Yu-De, Lin, Xiao-Yan, Tan, Zhi-Yuan, Sun, Tian-Xi, Liu, Zhi-Guo (2011) Measurement of inner surface roughness of capillary by an x-ray reflectivity method. Chinese Physics B, 20. 40702pp. doi:10.1088/1674-1056/20/4/040702

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Reference TypeJournal (article/letter/editorial)
TitleMeasurement of inner surface roughness of capillary by an x-ray reflectivity method
JournalChinese Physics B
AuthorsLi, Yu-DeAuthor
Lin, Xiao-YanAuthor
Tan, Zhi-YuanAuthor
Sun, Tian-XiAuthor
Liu, Zhi-GuoAuthor
Year2011 (April)Volume20
PublisherIOP Publishing
DOIdoi:10.1088/1674-1056/20/4/040702Search in ResearchGate
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Mindat Ref. ID6001317Long-form Identifiermindat:1:5:6001317:2
GUID0
Full ReferenceLi, Yu-De, Lin, Xiao-Yan, Tan, Zhi-Yuan, Sun, Tian-Xi, Liu, Zhi-Guo (2011) Measurement of inner surface roughness of capillary by an x-ray reflectivity method. Chinese Physics B, 20. 40702pp. doi:10.1088/1674-1056/20/4/040702
Plain TextLi, Yu-De, Lin, Xiao-Yan, Tan, Zhi-Yuan, Sun, Tian-Xi, Liu, Zhi-Guo (2011) Measurement of inner surface roughness of capillary by an x-ray reflectivity method. Chinese Physics B, 20. 40702pp. doi:10.1088/1674-1056/20/4/040702
In(n.d.) Chinese Physics B Vol. 20. IOP Publishing

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