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Dong, Lin, Sun, Guo-Sheng, Zheng, Liu, Liu, Xing-Fang, Zhang, Feng, Yan, Guo-Guo, Zhao, Wan-Shun, Wang, Lei, Li, Xi-Guang, Wang, Zhan-Guo (2012) Characterization of 4H—SiC substrates and epilayers by Fourier transform infrared reflectance spectroscopy. Chinese Physics B, 21. 47802pp. doi:10.1088/1674-1056/21/4/047802

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Reference TypeJournal (article/letter/editorial)
TitleCharacterization of 4H—SiC substrates and epilayers by Fourier transform infrared reflectance spectroscopy
JournalChinese Physics B
AuthorsDong, LinAuthor
Sun, Guo-ShengAuthor
Zheng, LiuAuthor
Liu, Xing-FangAuthor
Zhang, FengAuthor
Yan, Guo-GuoAuthor
Zhao, Wan-ShunAuthor
Wang, LeiAuthor
Li, Xi-GuangAuthor
Wang, Zhan-GuoAuthor
Year2012 (April)Volume21
PublisherIOP Publishing
DOIdoi:10.1088/1674-1056/21/4/047802Search in ResearchGate
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Mindat Ref. ID6002418Long-form Identifiermindat:1:5:6002418:7
GUID0
Full ReferenceDong, Lin, Sun, Guo-Sheng, Zheng, Liu, Liu, Xing-Fang, Zhang, Feng, Yan, Guo-Guo, Zhao, Wan-Shun, Wang, Lei, Li, Xi-Guang, Wang, Zhan-Guo (2012) Characterization of 4H—SiC substrates and epilayers by Fourier transform infrared reflectance spectroscopy. Chinese Physics B, 21. 47802pp. doi:10.1088/1674-1056/21/4/047802
Plain TextDong, Lin, Sun, Guo-Sheng, Zheng, Liu, Liu, Xing-Fang, Zhang, Feng, Yan, Guo-Guo, Zhao, Wan-Shun, Wang, Lei, Li, Xi-Guang, Wang, Zhan-Guo (2012) Characterization of 4H—SiC substrates and epilayers by Fourier transform infrared reflectance spectroscopy. Chinese Physics B, 21. 47802pp. doi:10.1088/1674-1056/21/4/047802
In(n.d.) Chinese Physics B Vol. 21. IOP Publishing

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