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Zhang, Yue, Pu, Shi, Lei, Xiao-Yi, Chen, Qing, Ma, Xiao-Hua, Hao, Yue (2013) Effects of stress conditions on the generation of negative bias temperature instability-associated interface traps. Chinese Physics B, 22. 117311pp. doi:10.1088/1674-1056/22/11/117311

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Reference TypeJournal (article/letter/editorial)
TitleEffects of stress conditions on the generation of negative bias temperature instability-associated interface traps
JournalChinese Physics B
AuthorsZhang, YueAuthor
Pu, ShiAuthor
Lei, Xiao-YiAuthor
Chen, QingAuthor
Ma, Xiao-HuaAuthor
Hao, YueAuthor
Year2013 (November)Volume22
PublisherIOP Publishing
DOIdoi:10.1088/1674-1056/22/11/117311Search in ResearchGate
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Mindat Ref. ID6003229Long-form Identifiermindat:1:5:6003229:2
GUID0
Full ReferenceZhang, Yue, Pu, Shi, Lei, Xiao-Yi, Chen, Qing, Ma, Xiao-Hua, Hao, Yue (2013) Effects of stress conditions on the generation of negative bias temperature instability-associated interface traps. Chinese Physics B, 22. 117311pp. doi:10.1088/1674-1056/22/11/117311
Plain TextZhang, Yue, Pu, Shi, Lei, Xiao-Yi, Chen, Qing, Ma, Xiao-Hua, Hao, Yue (2013) Effects of stress conditions on the generation of negative bias temperature instability-associated interface traps. Chinese Physics B, 22. 117311pp. doi:10.1088/1674-1056/22/11/117311
In(n.d.) Chinese Physics B Vol. 22. IOP Publishing

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