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Zhong, Can-Tao, Yu, Tong-Jun, Yan, Jian, Chen, Zhi-Zhong, Zhang, Guo-Yi (2013) Degradation behaviors of high power GaN-based blue light emitting diodes. Chinese Physics B, 22. 117804pp. doi:10.1088/1674-1056/22/11/117804

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Reference TypeJournal (article/letter/editorial)
TitleDegradation behaviors of high power GaN-based blue light emitting diodes
JournalChinese Physics B
AuthorsZhong, Can-TaoAuthor
Yu, Tong-JunAuthor
Yan, JianAuthor
Chen, Zhi-ZhongAuthor
Zhang, Guo-YiAuthor
Year2013 (November)Volume22
PublisherIOP Publishing
DOIdoi:10.1088/1674-1056/22/11/117804Search in ResearchGate
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Mindat Ref. ID6003242Long-form Identifiermindat:1:5:6003242:3
GUID0
Full ReferenceZhong, Can-Tao, Yu, Tong-Jun, Yan, Jian, Chen, Zhi-Zhong, Zhang, Guo-Yi (2013) Degradation behaviors of high power GaN-based blue light emitting diodes. Chinese Physics B, 22. 117804pp. doi:10.1088/1674-1056/22/11/117804
Plain TextZhong, Can-Tao, Yu, Tong-Jun, Yan, Jian, Chen, Zhi-Zhong, Zhang, Guo-Yi (2013) Degradation behaviors of high power GaN-based blue light emitting diodes. Chinese Physics B, 22. 117804pp. doi:10.1088/1674-1056/22/11/117804
In(n.d.) Chinese Physics B Vol. 22. IOP Publishing

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