Lü, Yuan-Jie, Feng, Zhi-Hong, Cai, Shu-Jun, Dun, Shao-Bo, Liu, Bo, Yin, Jia-Yun, Zhang, Xiong-Wen, Fang, Yu-Long, Lin, Zhao-Jun, Meng, Ling-Guo, Luan, Chong-Biao (2013) Influence of drain bias on the electron mobility in AlGaN/AlN/GaN heterostructure field-effect transistors. Chinese Physics B, 22. 67104pp. doi:10.1088/1674-1056/22/6/067104
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Influence of drain bias on the electron mobility in AlGaN/AlN/GaN heterostructure field-effect transistors | ||
| Journal | Chinese Physics B | ||
| Authors | Lü, Yuan-Jie | Author | |
| Feng, Zhi-Hong | Author | ||
| Cai, Shu-Jun | Author | ||
| Dun, Shao-Bo | Author | ||
| Liu, Bo | Author | ||
| Yin, Jia-Yun | Author | ||
| Zhang, Xiong-Wen | Author | ||
| Fang, Yu-Long | Author | ||
| Lin, Zhao-Jun | Author | ||
| Meng, Ling-Guo | Author | ||
| Luan, Chong-Biao | Author | ||
| Year | 2013 (June) | Volume | 22 |
| Publisher | IOP Publishing | ||
| DOI | doi:10.1088/1674-1056/22/6/067104Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 6003828 | Long-form Identifier | mindat:1:5:6003828:7 |
| GUID | 0 | ||
| Full Reference | Lü, Yuan-Jie, Feng, Zhi-Hong, Cai, Shu-Jun, Dun, Shao-Bo, Liu, Bo, Yin, Jia-Yun, Zhang, Xiong-Wen, Fang, Yu-Long, Lin, Zhao-Jun, Meng, Ling-Guo, Luan, Chong-Biao (2013) Influence of drain bias on the electron mobility in AlGaN/AlN/GaN heterostructure field-effect transistors. Chinese Physics B, 22. 67104pp. doi:10.1088/1674-1056/22/6/067104 | ||
| Plain Text | Lü, Yuan-Jie, Feng, Zhi-Hong, Cai, Shu-Jun, Dun, Shao-Bo, Liu, Bo, Yin, Jia-Yun, Zhang, Xiong-Wen, Fang, Yu-Long, Lin, Zhao-Jun, Meng, Ling-Guo, Luan, Chong-Biao (2013) Influence of drain bias on the electron mobility in AlGaN/AlN/GaN heterostructure field-effect transistors. Chinese Physics B, 22. 67104pp. doi:10.1088/1674-1056/22/6/067104 | ||
| In | (n.d.) Chinese Physics B Vol. 22. IOP Publishing | ||
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