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Wang, Wei-Ying, Liu, Gui-Peng, Jin, Peng, Mao, De-Feng, Li, Wei, Wang, Zhan-Guo, Tian, Wu, Chen, Chang-Qing (2014) Effects of interface roughness on photoluminescence full width at half maximum in GaN/AlGaN quantum wells. Chinese Physics B, 23. 117803pp. doi:10.1088/1674-1056/23/11/117803

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Reference TypeJournal (article/letter/editorial)
TitleEffects of interface roughness on photoluminescence full width at half maximum in GaN/AlGaN quantum wells
JournalChinese Physics B
AuthorsWang, Wei-YingAuthor
Liu, Gui-PengAuthor
Jin, PengAuthor
Mao, De-FengAuthor
Li, WeiAuthor
Wang, Zhan-GuoAuthor
Tian, WuAuthor
Chen, Chang-QingAuthor
Year2014 (November)Volume23
PublisherIOP Publishing
DOIdoi:10.1088/1674-1056/23/11/117803Search in ResearchGate
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Mindat Ref. ID6004462Long-form Identifiermindat:1:5:6004462:2
GUID0
Full ReferenceWang, Wei-Ying, Liu, Gui-Peng, Jin, Peng, Mao, De-Feng, Li, Wei, Wang, Zhan-Guo, Tian, Wu, Chen, Chang-Qing (2014) Effects of interface roughness on photoluminescence full width at half maximum in GaN/AlGaN quantum wells. Chinese Physics B, 23. 117803pp. doi:10.1088/1674-1056/23/11/117803
Plain TextWang, Wei-Ying, Liu, Gui-Peng, Jin, Peng, Mao, De-Feng, Li, Wei, Wang, Zhan-Guo, Tian, Wu, Chen, Chang-Qing (2014) Effects of interface roughness on photoluminescence full width at half maximum in GaN/AlGaN quantum wells. Chinese Physics B, 23. 117803pp. doi:10.1088/1674-1056/23/11/117803
In(n.d.) Chinese Physics B Vol. 23. IOP Publishing

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