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Huang, Shi-Hua, Liu, Jian (2014) Structural and electrical characterization of annealed Si 1βˆ’ x C x /SiC thin film prepared by magnetron sputtering. Chinese Physics B, 23. 58105pp. doi:10.1088/1674-1056/23/5/058105

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Reference TypeJournal (article/letter/editorial)
TitleStructural and electrical characterization of annealed Si 1βˆ’ x C x /SiC thin film prepared by magnetron sputtering
JournalChinese Physics B
AuthorsHuang, Shi-HuaAuthor
Liu, JianAuthor
Year2014 (May)Volume23
PublisherIOP Publishing
DOIdoi:10.1088/1674-1056/23/5/058105Search in ResearchGate
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Mindat Ref. ID6005012Long-form Identifiermindat:1:5:6005012:8
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Full ReferenceHuang, Shi-Hua, Liu, Jian (2014) Structural and electrical characterization of annealed Si 1βˆ’ x C x /SiC thin film prepared by magnetron sputtering. Chinese Physics B, 23. 58105pp. doi:10.1088/1674-1056/23/5/058105
Plain TextHuang, Shi-Hua, Liu, Jian (2014) Structural and electrical characterization of annealed Si 1βˆ’ x C x /SiC thin film prepared by magnetron sputtering. Chinese Physics B, 23. 58105pp. doi:10.1088/1674-1056/23/5/058105
In(n.d.) Chinese Physics B Vol. 23. IOP Publishing

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