Zheng, Qi-Wen, Cui, Jiang-Wei, Zhou, Hang, Yu, De-Zhao, Yu, Xue-Feng, Lu, Wu, Guo, Qi, Ren, Di-Yuan (2015) Analysis of functional failure mode of commercial deep sub-micron SRAM induced by total dose irradiation. Chinese Physics B, 24. 106106pp. doi:10.1088/1674-1056/24/10/106106
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Analysis of functional failure mode of commercial deep sub-micron SRAM induced by total dose irradiation | ||
| Journal | Chinese Physics B | ||
| Authors | Zheng, Qi-Wen | Author | |
| Cui, Jiang-Wei | Author | ||
| Zhou, Hang | Author | ||
| Yu, De-Zhao | Author | ||
| Yu, Xue-Feng | Author | ||
| Lu, Wu | Author | ||
| Guo, Qi | Author | ||
| Ren, Di-Yuan | Author | ||
| Year | 2015 (October) | Volume | 24 |
| Publisher | IOP Publishing | ||
| DOI | doi:10.1088/1674-1056/24/10/106106Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 6005614 | Long-form Identifier | mindat:1:5:6005614:0 |
| GUID | 0 | ||
| Full Reference | Zheng, Qi-Wen, Cui, Jiang-Wei, Zhou, Hang, Yu, De-Zhao, Yu, Xue-Feng, Lu, Wu, Guo, Qi, Ren, Di-Yuan (2015) Analysis of functional failure mode of commercial deep sub-micron SRAM induced by total dose irradiation. Chinese Physics B, 24. 106106pp. doi:10.1088/1674-1056/24/10/106106 | ||
| Plain Text | Zheng, Qi-Wen, Cui, Jiang-Wei, Zhou, Hang, Yu, De-Zhao, Yu, Xue-Feng, Lu, Wu, Guo, Qi, Ren, Di-Yuan (2015) Analysis of functional failure mode of commercial deep sub-micron SRAM induced by total dose irradiation. Chinese Physics B, 24. 106106pp. doi:10.1088/1674-1056/24/10/106106 | ||
| In | (n.d.) Chinese Physics B Vol. 24. IOP Publishing | ||
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