Wang, Jun, Hu, Hai-Yang, Deng, Can, He, Yun-Rui, Wang, Qi, Duan, Xiao-Feng, Huang, Yong-Qing, Ren, Xiao-Min (2015) Defect reduction in GaAs/Si film with InAs quantum-dot dislocation filter grown by metalorganic chemical vapor deposition. Chinese Physics B, 24. 28101pp. doi:10.1088/1674-1056/24/2/028101
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Defect reduction in GaAs/Si film with InAs quantum-dot dislocation filter grown by metalorganic chemical vapor deposition | ||
Journal | Chinese Physics B | ||
Authors | Wang, Jun | Author | |
Hu, Hai-Yang | Author | ||
Deng, Can | Author | ||
He, Yun-Rui | Author | ||
Wang, Qi | Author | ||
Duan, Xiao-Feng | Author | ||
Huang, Yong-Qing | Author | ||
Ren, Xiao-Min | Author | ||
Year | 2015 (February) | Volume | 24 |
Publisher | IOP Publishing | ||
DOI | doi:10.1088/1674-1056/24/2/028101Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 6005932 | Long-form Identifier | mindat:1:5:6005932:3 |
GUID | 0 | ||
Full Reference | Wang, Jun, Hu, Hai-Yang, Deng, Can, He, Yun-Rui, Wang, Qi, Duan, Xiao-Feng, Huang, Yong-Qing, Ren, Xiao-Min (2015) Defect reduction in GaAs/Si film with InAs quantum-dot dislocation filter grown by metalorganic chemical vapor deposition. Chinese Physics B, 24. 28101pp. doi:10.1088/1674-1056/24/2/028101 | ||
Plain Text | Wang, Jun, Hu, Hai-Yang, Deng, Can, He, Yun-Rui, Wang, Qi, Duan, Xiao-Feng, Huang, Yong-Qing, Ren, Xiao-Min (2015) Defect reduction in GaAs/Si film with InAs quantum-dot dislocation filter grown by metalorganic chemical vapor deposition. Chinese Physics B, 24. 28101pp. doi:10.1088/1674-1056/24/2/028101 | ||
In | (n.d.) Chinese Physics B Vol. 24. IOP Publishing |
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