Yang, Yi-Bin, Liu, Ming-Gang, Chen, Wei-Jie, Han, Xiao-Biao, Chen, Jie, Lin, Xiu-Qi, Lin, Jia-Li, Luo, Hui, Liao, Qiang, Zang, Wen-Jie, Chen, Yin-Song, Qiu, Yun-Ling, Wu, Zhi-Sheng, Liu, Yang, Zhang, Bai-Jun (2015) In-situ wafer bowing measurements of GaN grown on Si (111) substrate by reflectivity mapping in metal organic chemical vapor deposition system. Chinese Physics B, 24. 96103pp. doi:10.1088/1674-1056/24/9/096103
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | In-situ wafer bowing measurements of GaN grown on Si (111) substrate by reflectivity mapping in metal organic chemical vapor deposition system | ||
Journal | Chinese Physics B | ||
Authors | Yang, Yi-Bin | Author | |
Liu, Ming-Gang | Author | ||
Chen, Wei-Jie | Author | ||
Han, Xiao-Biao | Author | ||
Chen, Jie | Author | ||
Lin, Xiu-Qi | Author | ||
Lin, Jia-Li | Author | ||
Luo, Hui | Author | ||
Liao, Qiang | Author | ||
Zang, Wen-Jie | Author | ||
Chen, Yin-Song | Author | ||
Qiu, Yun-Ling | Author | ||
Wu, Zhi-Sheng | Author | ||
Liu, Yang | Author | ||
Zhang, Bai-Jun | Author | ||
Year | 2015 (September) | Volume | 24 |
Publisher | IOP Publishing | ||
DOI | doi:10.1088/1674-1056/24/9/096103Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 6006583 | Long-form Identifier | mindat:1:5:6006583:8 |
GUID | 0 | ||
Full Reference | Yang, Yi-Bin, Liu, Ming-Gang, Chen, Wei-Jie, Han, Xiao-Biao, Chen, Jie, Lin, Xiu-Qi, Lin, Jia-Li, Luo, Hui, Liao, Qiang, Zang, Wen-Jie, Chen, Yin-Song, Qiu, Yun-Ling, Wu, Zhi-Sheng, Liu, Yang, Zhang, Bai-Jun (2015) In-situ wafer bowing measurements of GaN grown on Si (111) substrate by reflectivity mapping in metal organic chemical vapor deposition system. Chinese Physics B, 24. 96103pp. doi:10.1088/1674-1056/24/9/096103 | ||
Plain Text | Yang, Yi-Bin, Liu, Ming-Gang, Chen, Wei-Jie, Han, Xiao-Biao, Chen, Jie, Lin, Xiu-Qi, Lin, Jia-Li, Luo, Hui, Liao, Qiang, Zang, Wen-Jie, Chen, Yin-Song, Qiu, Yun-Ling, Wu, Zhi-Sheng, Liu, Yang, Zhang, Bai-Jun (2015) In-situ wafer bowing measurements of GaN grown on Si (111) substrate by reflectivity mapping in metal organic chemical vapor deposition system. Chinese Physics B, 24. 96103pp. doi:10.1088/1674-1056/24/9/096103 | ||
In | (n.d.) Chinese Physics B Vol. 24. IOP Publishing |
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