Zhang, Dong, Wu, Chenfei, Xu, Weizong, Ren, Fangfang, Zhou, Dong, Yu, Peng, Zhang, Rong, Zheng, Youdou, Lu, Hai (2019) Investigation and active suppression of self-heating induced degradation in amorphous InGaZnO thin film transistors. Chinese Physics B, 28. 17303pp. doi:10.1088/1674-1056/28/1/017303
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Investigation and active suppression of self-heating induced degradation in amorphous InGaZnO thin film transistors | ||
| Journal | Chinese Physics B | ||
| Authors | Zhang, Dong | Author | |
| Wu, Chenfei | Author | ||
| Xu, Weizong | Author | ||
| Ren, Fangfang | Author | ||
| Zhou, Dong | Author | ||
| Yu, Peng | Author | ||
| Zhang, Rong | Author | ||
| Zheng, Youdou | Author | ||
| Lu, Hai | Author | ||
| Year | 2019 (January) | Volume | 28 |
| Publisher | IOP Publishing | ||
| DOI | doi:10.1088/1674-1056/28/1/017303Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 6009801 | Long-form Identifier | mindat:1:5:6009801:2 |
| GUID | 0 | ||
| Full Reference | Zhang, Dong, Wu, Chenfei, Xu, Weizong, Ren, Fangfang, Zhou, Dong, Yu, Peng, Zhang, Rong, Zheng, Youdou, Lu, Hai (2019) Investigation and active suppression of self-heating induced degradation in amorphous InGaZnO thin film transistors. Chinese Physics B, 28. 17303pp. doi:10.1088/1674-1056/28/1/017303 | ||
| Plain Text | Zhang, Dong, Wu, Chenfei, Xu, Weizong, Ren, Fangfang, Zhou, Dong, Yu, Peng, Zhang, Rong, Zheng, Youdou, Lu, Hai (2019) Investigation and active suppression of self-heating induced degradation in amorphous InGaZnO thin film transistors. Chinese Physics B, 28. 17303pp. doi:10.1088/1674-1056/28/1/017303 | ||
| In | (n.d.) Chinese Physics B Vol. 28. IOP Publishing | ||
See Also
These are possibly similar items as determined by title/reference text matching only.
