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Frost, F. (2002) The role of sample rotation and oblique ion incidence on quantum-dot formation by ion sputtering. Applied Physics A, 74. 131-133 doi:10.1007/s003390101029

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Reference TypeJournal (article/letter/editorial)
TitleThe role of sample rotation and oblique ion incidence on quantum-dot formation by ion sputtering
JournalApplied Physics A
AuthorsFrost, F.Author
Year2002 (January)Volume74
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/s003390101029Search in ResearchGate
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Mindat Ref. ID6010932Long-form Identifiermindat:1:5:6010932:7
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Full ReferenceFrost, F. (2002) The role of sample rotation and oblique ion incidence on quantum-dot formation by ion sputtering. Applied Physics A, 74. 131-133 doi:10.1007/s003390101029
Plain TextFrost, F. (2002) The role of sample rotation and oblique ion incidence on quantum-dot formation by ion sputtering. Applied Physics A, 74. 131-133 doi:10.1007/s003390101029
In(2002) Applied Physics A Vol. 74. Springer Science and Business Media LLC

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Bhattacharjee, S., Karmakar, P., Sinha, A.K., Charkrabarti, A. (2011) Ripple topography on thin ZnO films by grazing and oblique incidence ion sputtering. Applied Surface Science, 257. 6775-6778 doi:10.1016/j.apsusc.2011.02.123
Facsko, S., Kurz, H., Dekorsy, T. (2001) Energy dependence of quantum dot formation by ion sputtering. Physical Review B, 63 (16) doi:10.1103/physrevb.63.165329
Yewande, Emmanuel O., Kree, Reiner, Hartmann, Alexander K. (2006) Morphological regions and oblique-incidence dot formation in a model of surface sputtering. Physical Review B, 73 (11) doi:10.1103/physrevb.73.115434
Harrison, Matt P., Pearson, Daniel A., Bradley, R. Mark (2017) Emergence and detailed structure of terraced surfaces produced by oblique-incidence ion sputtering. Physical Review E, 96 (3) doi:10.1103/physreve.96.032804
Zhu, X. D., Nabighian, E. (1998) In situ monitoring of ion sputtering and thermal annealing of crystalline surfaces using an oblique-incidence optical reflectance difference method. Applied Physics Letters, 73 (19). 2736-2738 doi:10.1063/1.122574
Facsko, S., Bobek, T., Dekorsy, T., Kurz, H. (2001) Ordered Quantum Dot Formation by Ion Sputtering. physica status solidi (b), 224 (2). 537-540 doi:10.1002/1521-3951(200103)224:2<537::aid-pssb537>3.0.co;2-f
Ziberi, B., Frost, F., Rauschenbach, B., Höche, Th. (2005) Highly ordered self-organized dot patterns on Si surfaces by low-energy ion-beam erosion. Applied Physics Letters, 87 (3). 33113pp. doi:10.1063/1.2000342
Wu, C.H., Hechtl, E. (1992) Erosion of tungsten by self-sputtering and light ion irradiation at oblique angles of incidence. Journal of Nuclear Materials, 196. 569-572 doi:10.1016/s0022-3115(06)80100-5
Ziberi, B., Frost, F., Tartz, M., Neumann, H., Rauschenbach, B. (2008) Ripple rotation, pattern transitions, and long range ordered dots on silicon by ion beam erosion. Applied Physics Letters, 92 (6). 63102pp. doi:10.1063/1.2841641
Ioanoviciu, D., Cuna, C. (1986) Resolution test of an electric prism—oblique incidence magnet double focusing mass spectrometer. International Journal of Mass Spectrometry and Ion Processes, 74 (1). 129-131 doi:10.1016/0168-1176(86)85026-1
Völlner, J., Ziberi, B., Frost, F., Rauschenbach, B. (2011) Topography evolution mechanism on fused silica during low-energy ion beam sputtering. Journal of Applied Physics, 109 (4). 43501 doi:10.1063/1.3549170
 
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