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Tang, W.T., Chung, E., Kim, Y., So, P.T.C., Sheppard, C.J.R. (2007) Effects of using a metal layer in total internal reflection fluorescence microscopy. Applied Physics A, 89. 333-335 doi:10.1007/s00339-007-4119-1

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Reference TypeJournal (article/letter/editorial)
TitleEffects of using a metal layer in total internal reflection fluorescence microscopy
JournalApplied Physics A
AuthorsTang, W.T.Author
Chung, E.Author
Kim, Y.Author
So, P.T.C.Author
Sheppard, C.J.R.Author
Year2007 (August 25)Volume89
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/s00339-007-4119-1Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID6013000Long-form Identifiermindat:1:5:6013000:8
GUID0
Full ReferenceTang, W.T., Chung, E., Kim, Y., So, P.T.C., Sheppard, C.J.R. (2007) Effects of using a metal layer in total internal reflection fluorescence microscopy. Applied Physics A, 89. 333-335 doi:10.1007/s00339-007-4119-1
Plain TextTang, W.T., Chung, E., Kim, Y., So, P.T.C., Sheppard, C.J.R. (2007) Effects of using a metal layer in total internal reflection fluorescence microscopy. Applied Physics A, 89. 333-335 doi:10.1007/s00339-007-4119-1
In(2007) Applied Physics A Vol. 89. Springer Science and Business Media LLC

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Kang, Seong Ho, Kim, Yun-Jeong, Yeung, Edward S. (2007) Detection of single-molecule DNA hybridization by using dual-color total internal reflection fluorescence microscopy. Analytical and Bioanalytical Chemistry, 387 (8) 2663-2671 doi:10.1007/s00216-007-1134-1
Lai, C.-W., Chiu, M.-H. (2007) Surface profile measurement using laser-scanning angle deviation microscopy. Applied Physics A, 89. 403-406 doi:10.1007/s00339-007-4135-1
Xiang, Y., Dai, X., Wen, S. (2007) Photon tunneling in a frustrated total internal reflection structure with a lossy indefinite metamaterial barrier. Applied Physics A, 87. 251-257 doi:10.1007/s00339-006-3814-7
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Fiolka, R., Belyaev, Y., Ewers, H., Stemmer, A. (2008) Even illumination in total internal reflection fluorescence microscopy using laser light. Microscopy Research and Technique, 71 (1). 45-50 doi:10.1002/jemt.20527
Vinogradov, A. P., Zyablovsky, A. A., Dorofeenko, A. V., Pukhov, A. A. (2012) Total internal reflection in gain medium slab. Applied Physics A, 107. 89-92 doi:10.1007/s00339-011-6740-2
Virtanen, P., Heikkilä, T.T. (2007) Thermoelectric effects in superconducting proximity structures. Applied Physics A, 89. 625-637 doi:10.1007/s00339-007-4189-0
Kuznetsova, O B, Savchenko, E A, Andryakov, A A, Savchenko, E Y, Musakulova, Z A (2019) Image processing in total internal reflection fluorescence microscopy. Journal of Physics: Conference Series, 1236. 12039pp. doi:10.1088/1742-6596/1236/1/012039
Morten, J.P., Brataas, A., Belzig, W. (2007) Circuit theory for crossed Andreev reflection and nonlocal conductance. Applied Physics A, 89. 609-612 doi:10.1007/s00339-007-4194-3
Beckmann, D., v. Löhneysen, H. (2007) Negative four-terminal resistance as a probe of crossed Andreev reflection. Applied Physics A, 89. 603-607 doi:10.1007/s00339-007-4193-4
 
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