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Xue, Shoubin, Zhang, Xing, Huang, Ru, Zhuang, Huizhao (2009) Surface morphology of ZnO buffer layer and its effects on the growth of GaN films on Si substrates by magnetron sputtering. Applied Physics A, 94. 287-291 doi:10.1007/s00339-008-4777-7

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Reference TypeJournal (article/letter/editorial)
TitleSurface morphology of ZnO buffer layer and its effects on the growth of GaN films on Si substrates by magnetron sputtering
JournalApplied Physics A
AuthorsXue, ShoubinAuthor
Zhang, XingAuthor
Huang, RuAuthor
Zhuang, HuizhaoAuthor
Year2009 (February)Volume94
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/s00339-008-4777-7Search in ResearchGate
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Mindat Ref. ID6013707Long-form Identifiermindat:1:5:6013707:4
GUID0
Full ReferenceXue, Shoubin, Zhang, Xing, Huang, Ru, Zhuang, Huizhao (2009) Surface morphology of ZnO buffer layer and its effects on the growth of GaN films on Si substrates by magnetron sputtering. Applied Physics A, 94. 287-291 doi:10.1007/s00339-008-4777-7
Plain TextXue, Shoubin, Zhang, Xing, Huang, Ru, Zhuang, Huizhao (2009) Surface morphology of ZnO buffer layer and its effects on the growth of GaN films on Si substrates by magnetron sputtering. Applied Physics A, 94. 287-291 doi:10.1007/s00339-008-4777-7
In(2009) Applied Physics A Vol. 94. Springer Science and Business Media LLC


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