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Lee, Jihye, Kim, Seon Hee, Lee, Kang-Bong, Min, Byoung Koun, Lee, Yeonhee (2014) Improved quantitative analysis of Cu(In,Ga)Se2 thin films using MCs+-SIMS depth profiling. Applied Physics A, 115. 1355-1364 doi:10.1007/s00339-013-8009-4

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Reference TypeJournal (article/letter/editorial)
TitleImproved quantitative analysis of Cu(In,Ga)Se2 thin films using MCs+-SIMS depth profiling
JournalApplied Physics A
AuthorsLee, JihyeAuthor
Kim, Seon HeeAuthor
Lee, Kang-BongAuthor
Min, Byoung KounAuthor
Lee, YeonheeAuthor
Year2014 (June)Volume115
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/s00339-013-8009-4Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID6017002Long-form Identifiermindat:1:5:6017002:4
GUID0
Full ReferenceLee, Jihye, Kim, Seon Hee, Lee, Kang-Bong, Min, Byoung Koun, Lee, Yeonhee (2014) Improved quantitative analysis of Cu(In,Ga)Se2 thin films using MCs+-SIMS depth profiling. Applied Physics A, 115. 1355-1364 doi:10.1007/s00339-013-8009-4
Plain TextLee, Jihye, Kim, Seon Hee, Lee, Kang-Bong, Min, Byoung Koun, Lee, Yeonhee (2014) Improved quantitative analysis of Cu(In,Ga)Se2 thin films using MCs+-SIMS depth profiling. Applied Physics A, 115. 1355-1364 doi:10.1007/s00339-013-8009-4
In(2014) Applied Physics A Vol. 115. Springer Science and Business Media LLC

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Lee, Jihye, Doh, Jung-Mann, Hahn, Hoh-Gyu, Lee, Kang-Bong, Lee, Yeonhee (2017) Investigation of Asian lacquer films using ToF-SIMS and complementary analytical techniques. Surface and Interface Analysis, 49 (6). 479-487 doi:10.1002/sia.6181
Lim, Weon Cheol, Lee, Jihye, Won, Sungok, Lee, Yeonhee (2012) Characterization of Cu(InGa)Se2 (CIGS) thin films in solar cell devices. Surface and Interface Analysis, 44 (6). 724-728 doi:10.1002/sia.4820
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