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Schulz, Leander, Yun, Eui-Jung, Dodabalapur, Ananth (2014) Effects of contact resistance on the evaluation of charge carrier mobilities and transport parameters in amorphous zinc tin oxide thin-film transistors. Applied Physics A, 115. 1103-1107 doi:10.1007/s00339-014-8422-3

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Reference TypeJournal (article/letter/editorial)
TitleEffects of contact resistance on the evaluation of charge carrier mobilities and transport parameters in amorphous zinc tin oxide thin-film transistors
JournalApplied Physics A
AuthorsSchulz, LeanderAuthor
Yun, Eui-JungAuthor
Dodabalapur, AnanthAuthor
Year2014 (June)Volume115
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/s00339-014-8422-3Search in ResearchGate
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Mindat Ref. ID6017029Long-form Identifiermindat:1:5:6017029:1
GUID0
Full ReferenceSchulz, Leander, Yun, Eui-Jung, Dodabalapur, Ananth (2014) Effects of contact resistance on the evaluation of charge carrier mobilities and transport parameters in amorphous zinc tin oxide thin-film transistors. Applied Physics A, 115. 1103-1107 doi:10.1007/s00339-014-8422-3
Plain TextSchulz, Leander, Yun, Eui-Jung, Dodabalapur, Ananth (2014) Effects of contact resistance on the evaluation of charge carrier mobilities and transport parameters in amorphous zinc tin oxide thin-film transistors. Applied Physics A, 115. 1103-1107 doi:10.1007/s00339-014-8422-3
In(2014) Applied Physics A Vol. 115. Springer Science and Business Media LLC

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Lee, Chen-Guan, Cobb, Brian, Dodabalapur, Ananth (2010) Band transport and mobility edge in amorphous solution-processed zinc tin oxide thin-film transistors. Applied Physics Letters, 97 (20). 203505pp. doi:10.1063/1.3517502
Wang, Xiao, Dodabalapur, Ananth (2018) Trapped Carrier Scattering and Charge Transport in High‐Mobility Amorphous Metal Oxide Thin‐Film Transistors. Annalen der Physik, 530. 1800341pp. doi:10.1002/andp.201800341
Wang, Xiao, Dodabalapur, Ananth (2018) Trapped Carrier Scattering: Trapped Carrier Scattering and Charge Transport in High‐Mobility Amorphous Metal Oxide Thin‐Film Transistors (Ann. Phys. 12/2018). Annalen der Physik, 530. 1870044pp. doi:10.1002/andp.201870044
Yu, Kyeong Min, Bae, Byung Seong, Jung, Myunghee, Yun, Eui-Jung (2014) Charge transport at high temperatures in solution-processed zinc-tin-oxide thin-film transistors. Journal of the Korean Physical Society, 65 (2). 145-150 doi:10.3938/jkps.65.145
Lee, Chen-Guan, Dodabalapur, Ananth (2010) Solution-processed zinc–tin oxide thin-film transistors with low interfacial trap density and improved performance. Applied Physics Letters, 96 (24). 243501pp. doi:10.1063/1.3454241
Wang, Xiao, Dodabalapur, Ananth (2021) Interface roughness and interface roughness scattering in amorphous oxide thin-film transistors. Journal of Applied Physics, 130 (14) 145302pp. doi:10.1063/5.0065088
(2014) Influence of molybdenum source/drain electrode contact resistance in amorphous zinc–tin-oxide (a-ZTO) thin film transistors. Materials Research Bulletin, 58. 174-177 doi:10.1016/j.materresbull.2014.05.009
Seo, Han Byeol, Bae, Byung Seong, Bang, Hyo In, Yun, Eui-Jung (2018) Effects of Structure and Sputtering Parameters on the Device Properties of Tin-Oxide Thin-Film Transistors. Journal of the Korean Physical Society, 73 (3). 302-307 doi:10.3938/jkps.73.302
Ha, Tae-Jun, Dodabalapur, Ananth (2013) Photo stability of solution-processed low-voltage high mobility zinc-tin-oxide/ZrO2 thin-film transistors for transparent display applications. Applied Physics Letters, 102 (12). 123506pp. doi:10.1063/1.4795302
Wang, Liang, Fine, Daniel, Basu, Debarshi, Dodabalapur, Ananth (2007) Electric-field-dependent charge transport in organic thin-film transistors. Journal of Applied Physics, 101 (5). 54515pp. doi:10.1063/1.2496316
Dunn, Lawrence, Cobb, Brian, Reddy, Dharmendar, Dodabalapur, Ananth (2009) Dynamic characterization of charge transport in organic and polymer transistors. Applied Physics A, 95. 153-158 doi:10.1007/s00339-008-5059-0
 
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