Bahl, S.K., Bhagat, S.M. (1976) Time variation of the thickness and electrical resistivity of ultra thin films of a-Si. Journal of Non-Crystalline Solids, 21 (2) 279-281 doi:10.1016/0022-3093(76)90050-8
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Time variation of the thickness and electrical resistivity of ultra thin films of a-Si | ||
| Journal | Journal of Non-Crystalline Solids | ||
| Authors | Bahl, S.K. | Author | |
| Bhagat, S.M. | Author | ||
| Year | 1976 (July) | Volume | 21 |
| Issue | 2 | ||
| Publisher | Elsevier BV | ||
| DOI | doi:10.1016/0022-3093(76)90050-8Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 610415 | Long-form Identifier | mindat:1:5:610415:7 |
| GUID | 0 | ||
| Full Reference | Bahl, S.K., Bhagat, S.M. (1976) Time variation of the thickness and electrical resistivity of ultra thin films of a-Si. Journal of Non-Crystalline Solids, 21 (2) 279-281 doi:10.1016/0022-3093(76)90050-8 | ||
| Plain Text | Bahl, S.K., Bhagat, S.M. (1976) Time variation of the thickness and electrical resistivity of ultra thin films of a-Si. Journal of Non-Crystalline Solids, 21 (2) 279-281 doi:10.1016/0022-3093(76)90050-8 | ||
| In | (1976, July) Journal of Non-Crystalline Solids Vol. 21 (2) Elsevier BV | ||
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