Reference Type | Journal (article/letter/editorial) |
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Title | Dielectric function of amorphous silicon films, its oxidation and voids, studied by electron spectroscopy |
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Journal | Journal of Non-Crystalline Solids |
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Authors | Richter, H. | Author |
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Schröder, B. | Author |
Geiger, J. | Author |
Year | 1981 (March) | Volume | 43 |
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Issue | 2 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/0022-3093(81)90115-0Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 616722 | Long-form Identifier | mindat:1:5:616722:0 |
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GUID | 0 |
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Full Reference | Richter, H., Schröder, B., Geiger, J. (1981) Dielectric function of amorphous silicon films, its oxidation and voids, studied by electron spectroscopy. Journal of Non-Crystalline Solids, 43 (2) 153-164 doi:10.1016/0022-3093(81)90115-0 |
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Plain Text | Richter, H., Schröder, B., Geiger, J. (1981) Dielectric function of amorphous silicon films, its oxidation and voids, studied by electron spectroscopy. Journal of Non-Crystalline Solids, 43 (2) 153-164 doi:10.1016/0022-3093(81)90115-0 |
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In | (1981, March) Journal of Non-Crystalline Solids Vol. 43 (2) Elsevier BV |
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