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Avetyan, K. T., Levonyan, L. V., Semerjian, H. S., Arakelyan, M. M., Badalyan, O. M. (2015) Specific features of two diffraction schemes for a widely divergent X-ray beam. Crystallography Reports, 60 (2) 185-188 doi:10.1134/s1063774515010022

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Reference TypeJournal (article/letter/editorial)
TitleSpecific features of two diffraction schemes for a widely divergent X-ray beam
JournalCrystallography Reports
AuthorsAvetyan, K. T.Author
Levonyan, L. V.Author
Semerjian, H. S.Author
Arakelyan, M. M.Author
Badalyan, O. M.Author
Year2015 (March)Volume60
Issue2
PublisherPleiades Publishing Ltd
DOIdoi:10.1134/s1063774515010022Search in ResearchGate
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Mindat Ref. ID623150Long-form Identifiermindat:1:5:623150:1
GUID0
Full ReferenceAvetyan, K. T., Levonyan, L. V., Semerjian, H. S., Arakelyan, M. M., Badalyan, O. M. (2015) Specific features of two diffraction schemes for a widely divergent X-ray beam. Crystallography Reports, 60 (2) 185-188 doi:10.1134/s1063774515010022
Plain TextAvetyan, K. T., Levonyan, L. V., Semerjian, H. S., Arakelyan, M. M., Badalyan, O. M. (2015) Specific features of two diffraction schemes for a widely divergent X-ray beam. Crystallography Reports, 60 (2) 185-188 doi:10.1134/s1063774515010022
In(2015, March) Crystallography Reports Vol. 60 (2) Pleiades Publishing Ltd


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