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Andermann, George. (1966) Semitheoretical Approach to Interelement Correction Factors in Secondary X-Ray Emission Analysis. Analytical Chemistry, 38 (1). 82-86 doi:10.1021/ac60233a022

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Reference TypeJournal (article/letter/editorial)
TitleSemitheoretical Approach to Interelement Correction Factors in Secondary X-Ray Emission Analysis.
JournalAnalytical Chemistry
AuthorsAndermann, George.Author
Year1966 (January)Volume38
Issue1
PublisherAmerican Chemical Society (ACS)
DOIdoi:10.1021/ac60233a022Search in ResearchGate
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Mindat Ref. ID6299080Long-form Identifiermindat:1:5:6299080:2
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Full ReferenceAndermann, George. (1966) Semitheoretical Approach to Interelement Correction Factors in Secondary X-Ray Emission Analysis. Analytical Chemistry, 38 (1). 82-86 doi:10.1021/ac60233a022
Plain TextAndermann, George. (1966) Semitheoretical Approach to Interelement Correction Factors in Secondary X-Ray Emission Analysis. Analytical Chemistry, 38 (1). 82-86 doi:10.1021/ac60233a022
In(1966, January) Analytical Chemistry Vol. 38 (1) American Chemical Society (ACS)

See Also

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Andermann, George. (1961) Improvements in the X-Ray Emission Analysis of Cement Raw Mix. Analytical Chemistry, 33 (12). 1689-1695 doi:10.1021/ac60180a022
Andermann, George., Allen, J. D. (1961) X-Ray Emission Analysis of Finished Cements. Analytical Chemistry, 33 (12). 1695-1699 doi:10.1021/ac60180a023
Leroux, Jean., Mahmud, Mazhar. (1966) X-Ray Quantitative Analysis by an Emission-Transmission Method. Analytical Chemistry, 38 (1). 76-82 doi:10.1021/ac60233a021
Andermann, George., Kemp, J. W. (1958) Scattered X-Rays as Internal Standards in X-Ray Emission Spectroscopy. Analytical Chemistry, 30 (8). 1306-1309 doi:10.1021/ac60140a001
Shenberg, Cesia., Amiel, Saadia. (1974) Critical evaluation of correction methods for interelement effects in x-ray fluorescence analysis applied to binary mixtures. Analytical Chemistry, 46 (11). 1512-1516 doi:10.1021/ac60347a021
(1966) X-Ray Analysis Conference. Analytical Chemistry, 38 (3). 70 doi:10.1021/ac60235a773
Andermann, George., Fujiwara, Francis. (1984) Some fundamental aspects of surface-film analysis with variable angle ultrasoft x-ray fluorescence spectrometry. Analytical Chemistry, 56 (9). 1711-1715 doi:10.1021/ac00273a041
Rasberry, S. D., Heinrich, K. F. J. (1974) Calibration for interelement effects in x-ray fluorescence analysis. Analytical Chemistry, 46 (1). 81-89 doi:10.1021/ac60337a027
Taylor, David Leroy., Andermann, George. (1971) Evaluation of an isolated atom model in the use of scattered radiation for internal standardization in x-ray fluorescence analysis. Analytical Chemistry, 43 (6). 712-716 doi:10.1021/ac60301a018
Campbell, William J., Brown, James D., Thatcher, John W. (1966) X-Ray Absorption and Emission. Analytical Chemistry, 38 (5). 416-439 doi:10.1021/ac60237a029
(1966) Tektronix, Inc. Analytical Chemistry, 38 (1). 86 doi:10.1021/ac60233a772
 
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