Griscom, David L. (1992) Electron spin resonance characterization of self-trapped holes in amorphous silicon dioxide. Journal of Non-Crystalline Solids, 149 (1) 137-160 doi:10.1016/0022-3093(92)90062-o
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Electron spin resonance characterization of self-trapped holes in amorphous silicon dioxide | ||
| Journal | Journal of Non-Crystalline Solids | ||
| Authors | Griscom, David L. | Author | |
| Year | 1992 (October) | Volume | 149 |
| Issue | 1 | ||
| Publisher | Elsevier BV | ||
| DOI | doi:10.1016/0022-3093(92)90062-oSearch in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 632395 | Long-form Identifier | mindat:1:5:632395:4 |
| GUID | 0 | ||
| Full Reference | Griscom, David L. (1992) Electron spin resonance characterization of self-trapped holes in amorphous silicon dioxide. Journal of Non-Crystalline Solids, 149 (1) 137-160 doi:10.1016/0022-3093(92)90062-o | ||
| Plain Text | Griscom, David L. (1992) Electron spin resonance characterization of self-trapped holes in amorphous silicon dioxide. Journal of Non-Crystalline Solids, 149 (1) 137-160 doi:10.1016/0022-3093(92)90062-o | ||
| In | (1992, October) Journal of Non-Crystalline Solids Vol. 149 (1) Elsevier BV | ||
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