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Marszałek, M., Jaworski, J., Lekki, J., Marszałek, K., Stachura, Z., Voznyi, V., Bölling, O., Sulkio-Cleff, B. (2002) Characterization of Co/Cu multilayers growth by scanning probe microscopy. Surface Science, 507. 346-350 doi:10.1016/s0039-6028(02)01269-4

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Reference TypeJournal (article/letter/editorial)
TitleCharacterization of Co/Cu multilayers growth by scanning probe microscopy
JournalSurface Science
AuthorsMarszałek, M.Author
Jaworski, J.Author
Lekki, J.Author
Marszałek, K.Author
Stachura, Z.Author
Voznyi, V.Author
Bölling, O.Author
Sulkio-Cleff, B.Author
Year2002 (June)Volume507
PublisherElsevier BV
DOIdoi:10.1016/s0039-6028(02)01269-4Search in ResearchGate
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Mindat Ref. ID6476970Long-form Identifiermindat:1:5:6476970:1
GUID0
Full ReferenceMarszałek, M., Jaworski, J., Lekki, J., Marszałek, K., Stachura, Z., Voznyi, V., Bölling, O., Sulkio-Cleff, B. (2002) Characterization of Co/Cu multilayers growth by scanning probe microscopy. Surface Science, 507. 346-350 doi:10.1016/s0039-6028(02)01269-4
Plain TextMarszałek, M., Jaworski, J., Lekki, J., Marszałek, K., Stachura, Z., Voznyi, V., Bölling, O., Sulkio-Cleff, B. (2002) Characterization of Co/Cu multilayers growth by scanning probe microscopy. Surface Science, 507. 346-350 doi:10.1016/s0039-6028(02)01269-4
In(2002) Surface Science Vol. 507. Elsevier BV

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Marszałek, Marta, Jaworski, Jacek, Ka̧c, Małgorzata, Tokman, Valery, Marszałek, Konstanty, Bölling, Olaf, Sulkio-Cleff, Bernd (2004) Characterization by SFM of Co/Cu multilayers grown on an In buffer. Surface Science, 566. 137-142 doi:10.1016/j.susc.2004.05.035
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Lekka, M., Lekki, J., Marszałek, M., Stachura, Z., Cleff, B. (1998) Local Adhesive Surface Properties Studied by Force Microscopy. Acta Physica Polonica A, 93 (2). 421-424 doi:10.12693/aphyspola.93.421
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