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Abukawa, T., Kono, S. (1989) Photoelectron diffraction and low energy electron diffraction studies of Cs, K/Si(001) surfaces. Surface Science Letters, 214 (1). doi:10.1016/0167-2584(89)90043-1

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Reference TypeJournal (article/letter/editorial)
TitlePhotoelectron diffraction and low energy electron diffraction studies of Cs, K/Si(001) surfaces
JournalSurface Science Letters
AuthorsAbukawa, T.Author
Kono, S.Author
Year1989 (April)Volume214
Issue1
PublisherElsevier BV
DOIdoi:10.1016/0167-2584(89)90043-1Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID6496105Long-form Identifiermindat:1:5:6496105:3
GUID0
Full ReferenceAbukawa, T., Kono, S. (1989) Photoelectron diffraction and low energy electron diffraction studies of Cs, K/Si(001) surfaces. Surface Science Letters, 214 (1). doi:10.1016/0167-2584(89)90043-1
Plain TextAbukawa, T., Kono, S. (1989) Photoelectron diffraction and low energy electron diffraction studies of Cs, K/Si(001) surfaces. Surface Science Letters, 214 (1). doi:10.1016/0167-2584(89)90043-1
In(1989, April) Surface Science Letters Vol. 214 (1) Elsevier BV

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Abukawa, T., Kono, S. (1989) Photoelectron diffraction and low energy electron diffraction studies of Cs, K/Si(001) surfaces. Surface Science, 214 (1). 141-148 doi:10.1016/0039-6028(89)90413-5
Abukawa, T., Okane, T., Kono, S. (1991) Low energy electron diffraction and X-ray photoelectron diffraction study of the Cs/Si(001) surface: dependence on Cs coverage. Surface Science Letters, 256 (3). doi:10.1016/0167-2584(91)91192-y
Kono, S., Enta, Y., Abukawa, T., Kinoshita, T., Sakamoto, T. (1990) Photoelectron spectroscopy and photoelectron diffraction studies of Si(001)2Γ—1-K and -Cs surfaces. Applied Surface Science, 41. 75-81 doi:10.1016/0169-4332(89)90036-6
Abukawa, T., Okane, T., Kono, S. (1991) Low energy electron diffraction and X-ray photoelectron diffraction study of the Cs/Si(001) surface: dependence on Cs coverage. Surface Science, 256 (3). 370-378 doi:10.1016/0039-6028(91)90879-w
Higashiyama, K, Kono, S, Sagawa, T (1986) Study of the Si(111)√3 Γ— √3-Ga surface by X-ray photoelectron and auger electron diffraction. Surface Science Letters, 175 (3). doi:10.1016/0167-2584(86)90331-2
Shivaprasad, S.M., Abukawa, T., Yeom, H.W., Nakamura, M., Suzuki, S., Sato, S., Sakamoto, K., Sakamoto, T., Kono, S. (1995) Ag adsorption on a single domain Si(001)2 Γ— 1 surface studied by electron and photoelectron diffraction. Surface Science, 344 (3). doi:10.1016/0039-6028(95)01002-5
Kono, S., Higashiyama, K., Sagawa, T. (1986) X-ray photoelectron diffraction study of the atomic geometry of the Si(111)√3 Γ— √3-Ag surface. Surface Science Letters, 165 (1). doi:10.1016/0167-2584(86)91156-4
Abukawa, T., Kono, S. (1988) Photoelectron diffraction study of Si(001) 2 Γ— 1-K surface: Existence of a potassium double layer. Physical Review B, 37 (15) 9097-9099 doi:10.1103/physrevb.37.9097
Gunnella, R., Bullock, E. L., Patthey, L., Natoli, C. R., Abukawa, T., Kono, S., Johansson, L. S. O. (1998) Surface-core-level-shift low-energy photoelectron diffraction: The2Γ—1-Si(001) surface. Physical Review B, 57 (23) 14739-14748 doi:10.1103/physrevb.57.14739
SHIMOMURA, M., NAKAMURA, T., KIM, K.-S., ABUKAWA, T., TANI, J., KONO, S. (1999) STRUCTURE OF Si(001)-(4Γ—3)-In SURFACE STUDIED BY X-RAY PHOTOELECTRON DIFFRACTION. Surface Review and Letters, 6 (6). 1097-1102 doi:10.1142/s0218625x99001219
Shimomura, M, Abukawa, T, Yoshimura, K, Oh, J.H, Yeom, H.W, Kono, S (2001) Photoelectron diffraction study of the Si2p surface-core-level-shift of the Si( 001 )(1Γ—2)-Sb surface. Surface Science, 493 (1). 23-28 doi:10.1016/s0039-6028(01)01184-0
 
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