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Ichinokawa, T. (1990) Surface analytical scanning electron microscopy in ultrahigh vacuum combined with scanning tunnelling microscopy. Surface and Interface Analysis, 16 (1). 87-96 doi:10.1002/sia.740160120

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Reference TypeJournal (article/letter/editorial)
TitleSurface analytical scanning electron microscopy in ultrahigh vacuum combined with scanning tunnelling microscopy
JournalSurface and Interface Analysis
AuthorsIchinokawa, T.Author
Year1990 (July)Volume16
Issue1
PublisherWiley
DOIdoi:10.1002/sia.740160120Search in ResearchGate
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Mindat Ref. ID6502783Long-form Identifiermindat:1:5:6502783:3
GUID0
Full ReferenceIchinokawa, T. (1990) Surface analytical scanning electron microscopy in ultrahigh vacuum combined with scanning tunnelling microscopy. Surface and Interface Analysis, 16 (1). 87-96 doi:10.1002/sia.740160120
Plain TextIchinokawa, T. (1990) Surface analytical scanning electron microscopy in ultrahigh vacuum combined with scanning tunnelling microscopy. Surface and Interface Analysis, 16 (1). 87-96 doi:10.1002/sia.740160120
In(1990, July) Surface and Interface Analysis Vol. 16 (1) Wiley

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