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Zupp, Terry A., Fulghum, Julia E., Surman, David J. (1994) Imaging of polymer surfaces using X-ray photoelectron spectroscopy. Surface and Interface Analysis, 21 (2). 79-86 doi:10.1002/sia.740210204

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Reference TypeJournal (article/letter/editorial)
TitleImaging of polymer surfaces using X-ray photoelectron spectroscopy
JournalSurface and Interface Analysis
AuthorsZupp, Terry A.Author
Fulghum, Julia E.Author
Surman, David J.Author
Year1994 (February)Volume21
Issue2
PublisherWiley
DOIdoi:10.1002/sia.740210204Search in ResearchGate
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Mindat Ref. ID6504487Long-form Identifiermindat:1:5:6504487:6
GUID0
Full ReferenceZupp, Terry A., Fulghum, Julia E., Surman, David J. (1994) Imaging of polymer surfaces using X-ray photoelectron spectroscopy. Surface and Interface Analysis, 21 (2). 79-86 doi:10.1002/sia.740210204
Plain TextZupp, Terry A., Fulghum, Julia E., Surman, David J. (1994) Imaging of polymer surfaces using X-ray photoelectron spectroscopy. Surface and Interface Analysis, 21 (2). 79-86 doi:10.1002/sia.740210204
In(1994, February) Surface and Interface Analysis Vol. 21 (2) Wiley

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Tielsch, Brian J., Fulghum, Julia E. (1994) Application of angle-resolved XPS algorithms to overlayers and concentration gradients. Surface and Interface Analysis, 21 (9). 621-630 doi:10.1002/sia.740210905
Tielsch, Brian J., Fulghum, Julia E., Surman, David J. (1996) Differential Charging in XPS. Part II: Sample Mounting and X-ray Flux Effects on Heterogeneous Samples. Surface and Interface Analysis, 24 (7). 459-468 doi:10.1002/(sici)1096-9918(199607)24:7<459::aid-sia139>3.0.co;2-5
Thomas, Elizabeth A., Carrick, Alan R., Fulghum, Julia E. (1998) High-resolution x-ray photoelectron spectroscopy of aliphatic hydrocarbons. Surface and Interface Analysis, 26 (4). 278-289 doi:10.1002/(sici)1096-9918(199804)26:4<278::aid-sia372>3.0.co;2-r
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Jenkins, S. N., Castle, J. E. (1994) Development and practical application of a transmission x-ray photoelectron spectrometer. Surface and Interface Analysis, 21 (6). 382-386 doi:10.1002/sia.740210610
Morgan, David J. (2023) XPS insights: Sample degradation in X‐ray photoelectron spectroscopy. Surface and Interface Analysis, 55 (5) 331-335 doi:10.1002/sia.7205
Timbrell, P. Y., Puchert, M. K., Lamb, R. N. (1994) X-ray photoelectron imaging of germanosilicate optical fibre preforms. Surface and Interface Analysis, 21 (10). 731-736 doi:10.1002/sia.740211009
Fulghum, Julia E., Linton, Richard W. (1988) Quantitation of coverages on rough surfaces by XPS: An overview. Surface and Interface Analysis, 13 (4). 186-192 doi:10.1002/sia.740130404
Cordier, F., Ollivier, E. (1995) X-ray photoelectron spectroscopy study of aluminium surfaces prepared by anodizing processes. Surface and Interface Analysis, 23 (9). 601-608 doi:10.1002/sia.740230905
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